This paper describes a black-box model of mixed analog-digital VLSI circuits for the prediction of microcontroller electromagnetic emissions without disclosure of manufacturer data. The model is based on small-signal simulations performed at the analog and digital building-block level, considering also layout and technology parameters, and modeling the parasitic substrate coupling paths and the interconnects. The developed model allows system designers to predict the impact of microcontroller operation on the system-level EMEs by carrying out low-time consuming simulations in the early design phases of their products thus minimizing unnecessary costs and scheduling delays. In this paper, the black-box model of an 8-bit microcontroller is described and it is employed to predict the conducted emission delivered through the input-output ports.

In this paper a second order Volterra series model of an operational amplifier (opamp) circuit is presented. Such a model is suitable to the investigation of the rectification and demodulation effects of radio frequency (RF) interference superimposed on the nominal input signals and on the power supply voltage of an opamp. On the basis of the new model, some design criteria to improve the immunity of opamps to RF interference are proposed. Model predictions are verified by comparison with experimental test results.