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[Author] Masato YOSHIOKA(2hit)

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  • Find the 'Best' Solution from Multiple Analog Topologies via Pareto-Optimality

    Yu LIU  Masato YOSHIOKA  Katsumi HOMMA  Toshiyuki SHIBUYA  

     
    PAPER-Device and Circuit Modeling and Analysis

      Vol:
    E92-A No:12
      Page(s):
    3035-3043

    This paper presents a novel method using multi-objective optimization algorithm to automatically find the best solution from a topology library of analog circuits. Firstly this method abstracts the Pareto-front of each topology in the library by SPICE simulation. Then, the Pareto-front of the topology library is abstracted from the individual Pareto-fronts of topologies in the library followed by the theorem we proved. The best solution which is defined as the nearest point to specification on the Pareto-front of the topology library is then calculated by the equations derived from collinearity theorem. After the local searching using Nelder-Mead method maps the calculated best solution backs to design variable space, the non-dominated best solution is obtained. Comparing to the traditional optimization methods using single-objective optimization algorithms, this work can efficiently find the best non-dominated solution from multiple topologies for different specifications without additional time-consuming optimizing iterations. The experiments demonstrate that this method is feasible and practical in actual analog designs especially for uncertain or variant multi-dimensional specifications.

  • Split Capacitor DAC Mismatch Calibration in Successive Approximation ADC

    Yanfei CHEN  Xiaolei ZHU  Hirotaka TAMURA  Masaya KIBUNE  Yasumoto TOMITA  Takayuki HAMADA  Masato YOSHIOKA  Kiyoshi ISHIKAWA  Takeshi TAKAYAMA  Junji OGAWA  Sanroku TSUKAMOTO  Tadahiro KURODA  

     
    PAPER

      Vol:
    E93-C No:3
      Page(s):
    295-302

    Charge redistribution based successive approximation (SA) analog-to-digital converter (ADC) has the advantage of power efficiency. Split capacitor digital-to-analog converter (CDAC) technique implements two sets of binary-weighted capacitor arrays connected by a bridge capacitor so as to reduce both input load capacitance and area. However, capacitor mismatches degrade ADC performance in terms of DNL and INL. In this work, a split CDAC mismatch calibration method is proposed. A bridge capacitor larger than conventional design is implemented so that a tunable capacitor can be added in parallel with the lower-weight capacitor array to compensate for mismatches. To guarantee correct CDAC calibration, comparator offset is cancelled using a digital timing control charge compensation technique. To further reduce the input load capacitance, an extra unit capacitor is added to the higher-weight capacitor array. Instead of the lower-weight capacitor array, the extra unit capacitor and the higher-weight capacitor array sample analog input signal. An 8-bit SA ADC with 4-bit + 4-bit split CDAC has been implemented in a 65 nm CMOS process. The ADC has an input capacitance of 180 fF and occupies an active area of 0.03 mm2. Measured results of +0.2/-0.3LSB DNL and +0.3/-0.3LSB INL have been achieved after calibration.

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