An exact analysis for magnetostatic surface wave excitation by a single microstrip is presented. Conventional approaches for such an excitation problem do not explain experimental results in a reasonable manner. The theory proposed here explains radiation resistances obtained by experiments, owing to having considered the edge conditions and an expansion form of excitation current on the microstrip properly.

A kind of time domain reflectometry using deconvolution and envelope extraction process is presented for measuring microwave resonator characteristics, where data acquisition and data processing are performed entirely in the time domain. The proposed method may be used to characterize resonators which have Q values in the range between a few dozen and several hundred. The major drawback of the time domain measurement techniques is in general considered to be a low frequency resolution. In the proposed method, it is avoided skillfully.