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Critical path selection is very important in delay testing. Critical paths found by conventional static timing analysis (STA) tools are inadequate to represent the real timing of the circuit, since neither the testability of paths nor the statistical variation of cell delays caused by process variation is considered. This paper proposed a novel path selection method considering process variation. The circuit is firstly simplified by eliminating non-critical edges under statistical timing model, and then divided into sub-circuits, while each sub-circuit has only one prime input (PI) and one prime output (PO). Critical paths are selected only in critical sub-circuits. The concept of partially critical edges (PCEs) and completely critical edges (CCEs) are introduced to speed up the path selection procedure. Two path selection strategies are also presented to search for a testable critical path set to cover all the critical edges. The experimental results showed that the proposed circuit division approach is efficient in path number reduction, and PCEs and CCEs play an important role as a guideline during path selection.
Yuxiang FU Koji YAMAMOTO Yusuke KODA Takayuki NISHIO Masahiro MORIKURA Chun-hsiang HUANG Yushi SHIRATO Naoki KITA
Stochastic geometry analysis of wireless backhaul networks with beamforming in roadside environments is provided. In particular, a new model to analyze antenna gains, interference, and coverage in roadside environments of wireless networks with Poisson point process deployment of BSs is proposed. The received interference from the BSs with wired backhaul (referred to as anchored BS or A-BS) and the coverage probability of a typical BS are analyzed under different approximations of the location of the serving A-BS and combined antenna gains. Considering the beamforming, the coverage probability based on the aggregate interference consisting of the direct interference from the A-BSs and reflected interference from the BSs with wireless backhaul is also derived.