A visualization method of coherent source locations based on the Sampled Pattern Matching (SPM) method is described. Modified SPM method is proposed to improve the S/N, in which the measurement of the electric field distribution is repeated in appropriate time duration and eigenvalue decomposition of the covariance matrix is introduced. A combination of the modified SPM method with the Weighted Subspace Fitting (WSF) method is also proposed to estimate accurate source locations. A calibration technique by using a reference antenna to compensate the complex pattern of the receiving antenna is proposed. Experimental investigation to estimate source location for one dipole antenna and two dipole antennas is also made to demonstrate the validity of the proposed method.

A compensation method of the array element pattern is proposed to measure EM field distribution on an observation plane located several wavelengths away from electronic devices in a short time. Numerical and experimental data of the 3 and 5 element collinear dipole array sensors are presented to demonstrate the validity of the proposed method.