In this research, the performance degradation of the digital electronic equipment under electromagnetic (EM) disturbance was studied in order to investigate the interference of intra-equipment. To develop the evaluation method of the performance degradation, some communication indexes were measured under EM disturbance. From some experimental results, it is known that the performance degradation of the electronic equipment was estimated by the degradation of "through-put," one of the communication performance indexes. For further investigation of the interference of intra-equipment, the near EM field from a PCB of the electronic equipment and its performance degradation under EM disturbance were measured and compared. From the measured results, the relationship between near field measurement and performance degradation could be obtained in some extent. These facts enable us that the weak area under the EM disturbance application on PCB can be foreseen by measuring the near field emission from the equipment and vise versa.
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Takehiro TAKAHASHI, Hironori OKANIWA, Takashi SAKUSABE, Noboru SCHIBUYA, "A Study on Performance Degradation of Digital Electronic Equipment under Electromagnetic Disturbance" in IEICE TRANSACTIONS on Communications,
vol. E90-B, no. 6, pp. 1338-1343, June 2007, doi: 10.1093/ietcom/e90-b.6.1338.
Abstract: In this research, the performance degradation of the digital electronic equipment under electromagnetic (EM) disturbance was studied in order to investigate the interference of intra-equipment. To develop the evaluation method of the performance degradation, some communication indexes were measured under EM disturbance. From some experimental results, it is known that the performance degradation of the electronic equipment was estimated by the degradation of "through-put," one of the communication performance indexes. For further investigation of the interference of intra-equipment, the near EM field from a PCB of the electronic equipment and its performance degradation under EM disturbance were measured and compared. From the measured results, the relationship between near field measurement and performance degradation could be obtained in some extent. These facts enable us that the weak area under the EM disturbance application on PCB can be foreseen by measuring the near field emission from the equipment and vise versa.
URL: https://globals.ieice.org/en_transactions/communications/10.1093/ietcom/e90-b.6.1338/_p
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@ARTICLE{e90-b_6_1338,
author={Takehiro TAKAHASHI, Hironori OKANIWA, Takashi SAKUSABE, Noboru SCHIBUYA, },
journal={IEICE TRANSACTIONS on Communications},
title={A Study on Performance Degradation of Digital Electronic Equipment under Electromagnetic Disturbance},
year={2007},
volume={E90-B},
number={6},
pages={1338-1343},
abstract={In this research, the performance degradation of the digital electronic equipment under electromagnetic (EM) disturbance was studied in order to investigate the interference of intra-equipment. To develop the evaluation method of the performance degradation, some communication indexes were measured under EM disturbance. From some experimental results, it is known that the performance degradation of the electronic equipment was estimated by the degradation of "through-put," one of the communication performance indexes. For further investigation of the interference of intra-equipment, the near EM field from a PCB of the electronic equipment and its performance degradation under EM disturbance were measured and compared. From the measured results, the relationship between near field measurement and performance degradation could be obtained in some extent. These facts enable us that the weak area under the EM disturbance application on PCB can be foreseen by measuring the near field emission from the equipment and vise versa.},
keywords={},
doi={10.1093/ietcom/e90-b.6.1338},
ISSN={1745-1345},
month={June},}
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TY - JOUR
TI - A Study on Performance Degradation of Digital Electronic Equipment under Electromagnetic Disturbance
T2 - IEICE TRANSACTIONS on Communications
SP - 1338
EP - 1343
AU - Takehiro TAKAHASHI
AU - Hironori OKANIWA
AU - Takashi SAKUSABE
AU - Noboru SCHIBUYA
PY - 2007
DO - 10.1093/ietcom/e90-b.6.1338
JO - IEICE TRANSACTIONS on Communications
SN - 1745-1345
VL - E90-B
IS - 6
JA - IEICE TRANSACTIONS on Communications
Y1 - June 2007
AB - In this research, the performance degradation of the digital electronic equipment under electromagnetic (EM) disturbance was studied in order to investigate the interference of intra-equipment. To develop the evaluation method of the performance degradation, some communication indexes were measured under EM disturbance. From some experimental results, it is known that the performance degradation of the electronic equipment was estimated by the degradation of "through-put," one of the communication performance indexes. For further investigation of the interference of intra-equipment, the near EM field from a PCB of the electronic equipment and its performance degradation under EM disturbance were measured and compared. From the measured results, the relationship between near field measurement and performance degradation could be obtained in some extent. These facts enable us that the weak area under the EM disturbance application on PCB can be foreseen by measuring the near field emission from the equipment and vise versa.
ER -