Non Destructive Evaluation in Multilayer Structure Using the High Tc SQUID
Summary :
The High Tc SQUID was used in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using phase shift with no magnetic shielding around the specimen.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E88-C No.2 pp.188-191
- Publication Date
- 2005/02/01
- Publicized
- Online ISSN
- DOI
- 10.1093/ietele/e88-c.2.188
- Type of Manuscript
- Special Section PAPER (Special Section on Superconducting Electronic Devices and Their Applications)
- Category
- SQUIDs
Authors
Keyword
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Hideaki NAKANE, "Non Destructive Evaluation in Multilayer Structure Using the High Tc SQUID" in IEICE TRANSACTIONS on Electronics,
vol. E88-C, no. 2, pp. 188-191, February 2005, doi: 10.1093/ietele/e88-c.2.188.
Abstract: The High Tc SQUID was used in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using phase shift with no magnetic shielding around the specimen.
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e88-c.2.188/_p
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@ARTICLE{e88-c_2_188,
author={Hideaki NAKANE, },
journal={IEICE TRANSACTIONS on Electronics},
title={Non Destructive Evaluation in Multilayer Structure Using the High Tc SQUID},
year={2005},
volume={E88-C},
number={2},
pages={188-191},
abstract={The High Tc SQUID was used in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using phase shift with no magnetic shielding around the specimen.},
keywords={},
doi={10.1093/ietele/e88-c.2.188},
ISSN={},
month={February},}
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TY - JOUR
TI - Non Destructive Evaluation in Multilayer Structure Using the High Tc SQUID
T2 - IEICE TRANSACTIONS on Electronics
SP - 188
EP - 191
AU - Hideaki NAKANE
PY - 2005
DO - 10.1093/ietele/e88-c.2.188
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E88-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 2005
AB - The High Tc SQUID was used in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using phase shift with no magnetic shielding around the specimen.
ER -
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