An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz

Akira NAKAYAMA; Kazuya SHIMIZU

An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz

Akira NAKAYAMA, Kazuya SHIMIZU

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An improved reflection wave method was described for measurement of complex permittivity of low-loss materials over 100MHz-1GHz range. The residual impedance Z_r and stray admittance Y_s surrounding the test sample, which terminated the transmission line, were evaluated using sapphire as a reference material. The correction by the obtained Z_r and Y_s gave accurate values of complex permittivities of alumina and mullite ceramics as 100MHz-1GHz.

Publication: IEICE TRANSACTIONS on Electronics Vol.E77-C No.4 pp.633-638

Publication Date: 1994/04/25

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Type of Manuscript: PAPER

Category: Microwave and Millimeter Wave Technology

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Akira NAKAYAMA, Kazuya SHIMIZU, "An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz" in IEICE TRANSACTIONS on Electronics, vol. E77-C, no. 4, pp. 633-638, April 1994, doi: .
Abstract: An improved reflection wave method was described for measurement of complex permittivity of low-loss materials over 100MHz-1GHz range. The residual impedance Z_r and stray admittance Y_s surrounding the test sample, which terminated the transmission line, were evaluated using sapphire as a reference material. The correction by the obtained Z_r and Y_s gave accurate values of complex permittivities of alumina and mullite ceramics as 100MHz-1GHz.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e77-c_4_633/_p

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@ARTICLE{e77-c_4_633,
author={Akira NAKAYAMA, Kazuya SHIMIZU, },
journal={IEICE TRANSACTIONS on Electronics},
title={An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz},
year={1994},
volume={E77-C},
number={4},
pages={633-638},
abstract={An improved reflection wave method was described for measurement of complex permittivity of low-loss materials over 100MHz-1GHz range. The residual impedance Z_r and stray admittance Y_s surrounding the test sample, which terminated the transmission line, were evaluated using sapphire as a reference material. The correction by the obtained Z_r and Y_s gave accurate values of complex permittivities of alumina and mullite ceramics as 100MHz-1GHz.},
keywords={},
doi={},
ISSN={},
month={April},}

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TY - JOUR
TI - An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100 MHz-1GHz
T2 - IEICE TRANSACTIONS on Electronics
SP - 633
EP - 638
AU - Akira NAKAYAMA
AU - Kazuya SHIMIZU
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E77-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 1994
AB - An improved reflection wave method was described for measurement of complex permittivity of low-loss materials over 100MHz-1GHz range. The residual impedance Z_r and stray admittance Y_s surrounding the test sample, which terminated the transmission line, were evaluated using sapphire as a reference material. The correction by the obtained Z_r and Y_s gave accurate values of complex permittivities of alumina and mullite ceramics as 100MHz-1GHz.
ER -