A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectric Material

Akira NAKAYAMA

A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectric Material

Akira NAKAYAMA

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This paper describes a nondestructive measurement method for complex permittivity of dielectric material at pseudo microwave frequencies. The resonator used in this study has a cylindrical cavity filled with a sapphire material of a well known complex permittivity. The resonator is divided into two parts at the center. A dielectric substrate specimen is clamped with these halves. Relative permittivity εand loss tangent tan δ of the specimen are obtained at 3 GHz using the TE₀₁₁ resonance mode. The accuracy of the present method is evaluated through the comparison of the measured values by the new method with those at around 10 GHz by the conventional empty cavity resonator method. The errors of measurements are smaller than 1% and 110⁵ for εand tan δ, respectively.

Publication: IEICE TRANSACTIONS on Electronics Vol.E77-C No.6 pp.894-899

Publication Date: 1994/06/25

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Type of Manuscript: Special Section PAPER (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)

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Akira NAKAYAMA, "A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectric Material" in IEICE TRANSACTIONS on Electronics, vol. E77-C, no. 6, pp. 894-899, June 1994, doi: .
Abstract: This paper describes a nondestructive measurement method for complex permittivity of dielectric material at pseudo microwave frequencies. The resonator used in this study has a cylindrical cavity filled with a sapphire material of a well known complex permittivity. The resonator is divided into two parts at the center. A dielectric substrate specimen is clamped with these halves. Relative permittivity εand loss tangent tan δ of the specimen are obtained at 3 GHz using the TE₀₁₁ resonance mode. The accuracy of the present method is evaluated through the comparison of the measured values by the new method with those at around 10 GHz by the conventional empty cavity resonator method. The errors of measurements are smaller than 1% and 110⁵ for εand tan δ, respectively.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e77-c_6_894/_p

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@ARTICLE{e77-c_6_894,
author={Akira NAKAYAMA, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectric Material},
year={1994},
volume={E77-C},
number={6},
pages={894-899},
abstract={This paper describes a nondestructive measurement method for complex permittivity of dielectric material at pseudo microwave frequencies. The resonator used in this study has a cylindrical cavity filled with a sapphire material of a well known complex permittivity. The resonator is divided into two parts at the center. A dielectric substrate specimen is clamped with these halves. Relative permittivity εand loss tangent tan δ of the specimen are obtained at 3 GHz using the TE₀₁₁ resonance mode. The accuracy of the present method is evaluated through the comparison of the measured values by the new method with those at around 10 GHz by the conventional empty cavity resonator method. The errors of measurements are smaller than 1% and 110⁵ for εand tan δ, respectively.},
keywords={},
doi={},
ISSN={},
month={June},}

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TY - JOUR
TI - A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectric Material
T2 - IEICE TRANSACTIONS on Electronics
SP - 894
EP - 899
AU - Akira NAKAYAMA
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E77-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 1994
AB - This paper describes a nondestructive measurement method for complex permittivity of dielectric material at pseudo microwave frequencies. The resonator used in this study has a cylindrical cavity filled with a sapphire material of a well known complex permittivity. The resonator is divided into two parts at the center. A dielectric substrate specimen is clamped with these halves. Relative permittivity εand loss tangent tan δ of the specimen are obtained at 3 GHz using the TE₀₁₁ resonance mode. The accuracy of the present method is evaluated through the comparison of the measured values by the new method with those at around 10 GHz by the conventional empty cavity resonator method. The errors of measurements are smaller than 1% and 110⁵ for εand tan δ, respectively.
ER -