A Temperature-Insensitive Current Controlled CMOS Output Driver

Cheol-Hee LEE; Jae-Yoon SIM; Hong-June PARK

A Temperature-Insensitive Current Controlled CMOS Output Driver

Cheol-Hee LEE, Jae-Yoon SIM, Hong-June PARK

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A current controlled CMOS output driver was designed by using a temperature-insensitive reference current generator. It eliminates the need for overdesign of the driver transistor size to meet the delay specification at high temperature. Comparison with the conventional CMOS output driver with the same transistor size showed that the ground bounce noise was reduced by 2.5 times and the delay time was increased by 1.4 times, at 25 for 50pF load. The temperature variations of the DC pull-up and pull-down currents of the new output driver were 4% within the temperature range from -15 to 125 compared to the variations of 40 and 60% for pull-up and pull-down respectively for the conventional output driver. The temperature insensitivity of the reference current generator was achieved by multiplying two current components. one which is proportional to mobility and the other which is inversely proportional to mobility, by using a CMOS square root circuit. The temperature variation of the DC output current of the reference current generator alone was 0.77% within the entire temperature range from -15 to 125.

Publication: IEICE TRANSACTIONS on Electronics Vol.E79-C No.12 pp.1726-1732

Publication Date: 1996/12/25

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Type of Manuscript: PAPER

Category: Electronic Circuits

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Cheol-Hee LEE, Jae-Yoon SIM, Hong-June PARK, "A Temperature-Insensitive Current Controlled CMOS Output Driver" in IEICE TRANSACTIONS on Electronics, vol. E79-C, no. 12, pp. 1726-1732, December 1996, doi: .
Abstract: A current controlled CMOS output driver was designed by using a temperature-insensitive reference current generator. It eliminates the need for overdesign of the driver transistor size to meet the delay specification at high temperature. Comparison with the conventional CMOS output driver with the same transistor size showed that the ground bounce noise was reduced by 2.5 times and the delay time was increased by 1.4 times, at 25 for 50pF load. The temperature variations of the DC pull-up and pull-down currents of the new output driver were 4% within the temperature range from -15 to 125 compared to the variations of 40 and 60% for pull-up and pull-down respectively for the conventional output driver. The temperature insensitivity of the reference current generator was achieved by multiplying two current components. one which is proportional to mobility and the other which is inversely proportional to mobility, by using a CMOS square root circuit. The temperature variation of the DC output current of the reference current generator alone was 0.77% within the entire temperature range from -15 to 125.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e79-c_12_1726/_p

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@ARTICLE{e79-c_12_1726,
author={Cheol-Hee LEE, Jae-Yoon SIM, Hong-June PARK, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Temperature-Insensitive Current Controlled CMOS Output Driver},
year={1996},
volume={E79-C},
number={12},
pages={1726-1732},
abstract={A current controlled CMOS output driver was designed by using a temperature-insensitive reference current generator. It eliminates the need for overdesign of the driver transistor size to meet the delay specification at high temperature. Comparison with the conventional CMOS output driver with the same transistor size showed that the ground bounce noise was reduced by 2.5 times and the delay time was increased by 1.4 times, at 25 for 50pF load. The temperature variations of the DC pull-up and pull-down currents of the new output driver were 4% within the temperature range from -15 to 125 compared to the variations of 40 and 60% for pull-up and pull-down respectively for the conventional output driver. The temperature insensitivity of the reference current generator was achieved by multiplying two current components. one which is proportional to mobility and the other which is inversely proportional to mobility, by using a CMOS square root circuit. The temperature variation of the DC output current of the reference current generator alone was 0.77% within the entire temperature range from -15 to 125.},
keywords={},
doi={},
ISSN={},
month={December},}

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TY - JOUR
TI - A Temperature-Insensitive Current Controlled CMOS Output Driver
T2 - IEICE TRANSACTIONS on Electronics
SP - 1726
EP - 1732
AU - Cheol-Hee LEE
AU - Jae-Yoon SIM
AU - Hong-June PARK
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E79-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 1996
AB - A current controlled CMOS output driver was designed by using a temperature-insensitive reference current generator. It eliminates the need for overdesign of the driver transistor size to meet the delay specification at high temperature. Comparison with the conventional CMOS output driver with the same transistor size showed that the ground bounce noise was reduced by 2.5 times and the delay time was increased by 1.4 times, at 25 for 50pF load. The temperature variations of the DC pull-up and pull-down currents of the new output driver were 4% within the temperature range from -15 to 125 compared to the variations of 40 and 60% for pull-up and pull-down respectively for the conventional output driver. The temperature insensitivity of the reference current generator was achieved by multiplying two current components. one which is proportional to mobility and the other which is inversely proportional to mobility, by using a CMOS square root circuit. The temperature variation of the DC output current of the reference current generator alone was 0.77% within the entire temperature range from -15 to 125.
ER -