FD-TD Analysis of Coaxial Probes Inserted into Rectangular Waveguides

Atsushi SANADA; Minoru SANAGI; Shigeji NOGI; Kuniyoshi YAMANE

FD-TD Analysis of Coaxial Probes Inserted into Rectangular Waveguides

Atsushi SANADA, Minoru SANAGI, Shigeji NOGI, Kuniyoshi YAMANE

Full Text Views

0

Share
Cite this

Summary :

Full-wave FD-TD analysis has been carried out for coaxial probes inserted into waveguides. Both single and symmetrically placed paired coaxial probe structures have been discussed and we have revealed the relation between equivalent circuit parameters and structural parameters of the coaxial probes including cases for large diameter and extension length, which is useful for practical waveguide circuit design. The equivalent circuit parameters calculated from the scattering parameters agreed well with corresponding measured data. From the calculated field in a waveguide, field concentration at sharp edges of probe sole or base, which ought to be taken into account for high power application design has been also discussed. Besides, amplitudes of higher order modes in waveguides excited by coaxial probes or pairs of coaxial probes has been calculated so as to estimate the range beyond which higher order modes decay sufficiently. This estimation is necessary for simple and easy design of probe using circuit theory.

Publication: IEICE TRANSACTIONS on Electronics Vol.E81-C No.12 pp.1821-1830

Publication Date: 1998/12/25

Publicized

Online ISSN

DOI

Type of Manuscript: Special Section PAPER (Special Issue on Computational Electromagnetics)

Category

Cite this

Copy

Atsushi SANADA, Minoru SANAGI, Shigeji NOGI, Kuniyoshi YAMANE, "FD-TD Analysis of Coaxial Probes Inserted into Rectangular Waveguides" in IEICE TRANSACTIONS on Electronics, vol. E81-C, no. 12, pp. 1821-1830, December 1998, doi: .
Abstract: Full-wave FD-TD analysis has been carried out for coaxial probes inserted into waveguides. Both single and symmetrically placed paired coaxial probe structures have been discussed and we have revealed the relation between equivalent circuit parameters and structural parameters of the coaxial probes including cases for large diameter and extension length, which is useful for practical waveguide circuit design. The equivalent circuit parameters calculated from the scattering parameters agreed well with corresponding measured data. From the calculated field in a waveguide, field concentration at sharp edges of probe sole or base, which ought to be taken into account for high power application design has been also discussed. Besides, amplitudes of higher order modes in waveguides excited by coaxial probes or pairs of coaxial probes has been calculated so as to estimate the range beyond which higher order modes decay sufficiently. This estimation is necessary for simple and easy design of probe using circuit theory.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e81-c_12_1821/_p

Copy

@ARTICLE{e81-c_12_1821,
author={Atsushi SANADA, Minoru SANAGI, Shigeji NOGI, Kuniyoshi YAMANE, },
journal={IEICE TRANSACTIONS on Electronics},
title={FD-TD Analysis of Coaxial Probes Inserted into Rectangular Waveguides},
year={1998},
volume={E81-C},
number={12},
pages={1821-1830},
abstract={Full-wave FD-TD analysis has been carried out for coaxial probes inserted into waveguides. Both single and symmetrically placed paired coaxial probe structures have been discussed and we have revealed the relation between equivalent circuit parameters and structural parameters of the coaxial probes including cases for large diameter and extension length, which is useful for practical waveguide circuit design. The equivalent circuit parameters calculated from the scattering parameters agreed well with corresponding measured data. From the calculated field in a waveguide, field concentration at sharp edges of probe sole or base, which ought to be taken into account for high power application design has been also discussed. Besides, amplitudes of higher order modes in waveguides excited by coaxial probes or pairs of coaxial probes has been calculated so as to estimate the range beyond which higher order modes decay sufficiently. This estimation is necessary for simple and easy design of probe using circuit theory.},
keywords={},
doi={},
ISSN={},
month={December},}

Copy

TY - JOUR
TI - FD-TD Analysis of Coaxial Probes Inserted into Rectangular Waveguides
T2 - IEICE TRANSACTIONS on Electronics
SP - 1821
EP - 1830
AU - Atsushi SANADA
AU - Minoru SANAGI
AU - Shigeji NOGI
AU - Kuniyoshi YAMANE
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E81-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 1998
AB - Full-wave FD-TD analysis has been carried out for coaxial probes inserted into waveguides. Both single and symmetrically placed paired coaxial probe structures have been discussed and we have revealed the relation between equivalent circuit parameters and structural parameters of the coaxial probes including cases for large diameter and extension length, which is useful for practical waveguide circuit design. The equivalent circuit parameters calculated from the scattering parameters agreed well with corresponding measured data. From the calculated field in a waveguide, field concentration at sharp edges of probe sole or base, which ought to be taken into account for high power application design has been also discussed. Besides, amplitudes of higher order modes in waveguides excited by coaxial probes or pairs of coaxial probes has been calculated so as to estimate the range beyond which higher order modes decay sufficiently. This estimation is necessary for simple and easy design of probe using circuit theory.
ER -