Design and Analysis of Ultra-Low Power Glitch-Free Programmable Voltage Detector Based on Multiple Voltage Copier

Teruki SOMEYA; Hiroshi FUKETA; Kenichi MATSUNAGA; Hiroki MORIMURA; Takayasu SAKURAI; Makoto TAKAMIYA

doi:10.1587/transele.E100.C.349

Design and Analysis of Ultra-Low Power Glitch-Free Programmable Voltage Detector Based on Multiple Voltage Copier

Teruki SOMEYA, Hiroshi FUKETA, Kenichi MATSUNAGA, Hiroki MORIMURA, Takayasu SAKURAI, Makoto TAKAMIYA

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This paper presents an ultra-low power and temperature-independent voltage detector with a post-fabrication programming method, and presents a theoretical analysis and measurement results. The voltage detector is composed of a programmable voltage detector and a glitch-free voltage detector to realize both programmable and glitch-free operation. The programmable voltage detector enables the programmable detection voltages in the range from 0.52V to 0.85V in steps of less than 49mV. The glitch-free voltage detector enables glitch-free operation when the supply voltage is near 0V. A multiple voltage copier (MVC) in the programmable voltage detector is newly proposed to eliminate the tradeoff between the temperature dependence and power consumption. The design consideration and a theoretical analysis of the MVC are introduced to clarify the relationship between the current in the MVC and the accuracy of the duplication. From the analysis, the tradeoff between the duplication error and the current of MVC is introduced. The proposed voltage detector is fabricated in a 250nm CMOS process. The measurement results show that the power consumption is 248pW and the temperature coefficient is 0.11mV/°C.

Publication: IEICE TRANSACTIONS on Electronics Vol.E100-C No.4 pp.349-358

Publication Date: 2017/04/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1587/transele.E100.C.349

Type of Manuscript: Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)

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Authors

Teruki SOMEYA
  University of Tokyo
Hiroshi FUKETA
  University of Tokyo
Kenichi MATSUNAGA
  NTT Corporation
Hiroki MORIMURA
  NTT Corporation
Takayasu SAKURAI
  University of Tokyo
Makoto TAKAMIYA
  University of Tokyo

Keyword

voltage detector, voltage reference, low power, low voltage, multiple voltage copier

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Teruki SOMEYA, Hiroshi FUKETA, Kenichi MATSUNAGA, Hiroki MORIMURA, Takayasu SAKURAI, Makoto TAKAMIYA, "Design and Analysis of Ultra-Low Power Glitch-Free Programmable Voltage Detector Based on Multiple Voltage Copier" in IEICE TRANSACTIONS on Electronics, vol. E100-C, no. 4, pp. 349-358, April 2017, doi: 10.1587/transele.E100.C.349.
Abstract: This paper presents an ultra-low power and temperature-independent voltage detector with a post-fabrication programming method, and presents a theoretical analysis and measurement results. The voltage detector is composed of a programmable voltage detector and a glitch-free voltage detector to realize both programmable and glitch-free operation. The programmable voltage detector enables the programmable detection voltages in the range from 0.52V to 0.85V in steps of less than 49mV. The glitch-free voltage detector enables glitch-free operation when the supply voltage is near 0V. A multiple voltage copier (MVC) in the programmable voltage detector is newly proposed to eliminate the tradeoff between the temperature dependence and power consumption. The design consideration and a theoretical analysis of the MVC are introduced to clarify the relationship between the current in the MVC and the accuracy of the duplication. From the analysis, the tradeoff between the duplication error and the current of MVC is introduced. The proposed voltage detector is fabricated in a 250nm CMOS process. The measurement results show that the power consumption is 248pW and the temperature coefficient is 0.11mV/°C.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E100.C.349/_p

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@ARTICLE{e100-c_4_349,
author={Teruki SOMEYA, Hiroshi FUKETA, Kenichi MATSUNAGA, Hiroki MORIMURA, Takayasu SAKURAI, Makoto TAKAMIYA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Design and Analysis of Ultra-Low Power Glitch-Free Programmable Voltage Detector Based on Multiple Voltage Copier},
year={2017},
volume={E100-C},
number={4},
pages={349-358},
abstract={This paper presents an ultra-low power and temperature-independent voltage detector with a post-fabrication programming method, and presents a theoretical analysis and measurement results. The voltage detector is composed of a programmable voltage detector and a glitch-free voltage detector to realize both programmable and glitch-free operation. The programmable voltage detector enables the programmable detection voltages in the range from 0.52V to 0.85V in steps of less than 49mV. The glitch-free voltage detector enables glitch-free operation when the supply voltage is near 0V. A multiple voltage copier (MVC) in the programmable voltage detector is newly proposed to eliminate the tradeoff between the temperature dependence and power consumption. The design consideration and a theoretical analysis of the MVC are introduced to clarify the relationship between the current in the MVC and the accuracy of the duplication. From the analysis, the tradeoff between the duplication error and the current of MVC is introduced. The proposed voltage detector is fabricated in a 250nm CMOS process. The measurement results show that the power consumption is 248pW and the temperature coefficient is 0.11mV/°C.},
keywords={},
doi={10.1587/transele.E100.C.349},
ISSN={1745-1353},
month={April},}

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TY - JOUR
TI - Design and Analysis of Ultra-Low Power Glitch-Free Programmable Voltage Detector Based on Multiple Voltage Copier
T2 - IEICE TRANSACTIONS on Electronics
SP - 349
EP - 358
AU - Teruki SOMEYA
AU - Hiroshi FUKETA
AU - Kenichi MATSUNAGA
AU - Hiroki MORIMURA
AU - Takayasu SAKURAI
AU - Makoto TAKAMIYA
PY - 2017
DO - 10.1587/transele.E100.C.349
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E100-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 2017
AB - This paper presents an ultra-low power and temperature-independent voltage detector with a post-fabrication programming method, and presents a theoretical analysis and measurement results. The voltage detector is composed of a programmable voltage detector and a glitch-free voltage detector to realize both programmable and glitch-free operation. The programmable voltage detector enables the programmable detection voltages in the range from 0.52V to 0.85V in steps of less than 49mV. The glitch-free voltage detector enables glitch-free operation when the supply voltage is near 0V. A multiple voltage copier (MVC) in the programmable voltage detector is newly proposed to eliminate the tradeoff between the temperature dependence and power consumption. The design consideration and a theoretical analysis of the MVC are introduced to clarify the relationship between the current in the MVC and the accuracy of the duplication. From the analysis, the tradeoff between the duplication error and the current of MVC is introduced. The proposed voltage detector is fabricated in a 250nm CMOS process. The measurement results show that the power consumption is 248pW and the temperature coefficient is 0.11mV/°C.
ER -