In this paper, a 65 nm 1.2 V 7-bit 1GSPS folding-interpolation A/D converter with a digitally self-calibrated vector generator is proposed. The folding rate is 2 and the interpolation rate is 8. A self-calibrated vector generation circuit with a feedback loop and a recursive digital code inspection is described. The circuit reduces the variation of the offset voltage caused by process mismatches, parasitic resistors, and parasitic capacitances. The chip has been fabricated with a 65 nm 1-poly 6-metal CMOS technology. The effective chip area is 0.87 mm2 and the power consumption is about 110 mW with a 1.2 V power supply. The measured SNDR is about 39.1 dB when the input frequency is 250 MHz at a 1 GHz sampling frequency. The measured SNDR is drastically improved in comparison with the same ADC without any calibration.
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Daeyun KIM, Minkyu SONG, "A 65 nm 1.2 V 7-bit 1 GSPS Folding-Interpolation A/D Converter with a Digitally Self-Calibrated Vector Generator" in IEICE TRANSACTIONS on Electronics,
vol. E94-C, no. 7, pp. 1199-1205, July 2011, doi: 10.1587/transele.E94.C.1199.
Abstract: In this paper, a 65 nm 1.2 V 7-bit 1GSPS folding-interpolation A/D converter with a digitally self-calibrated vector generator is proposed. The folding rate is 2 and the interpolation rate is 8. A self-calibrated vector generation circuit with a feedback loop and a recursive digital code inspection is described. The circuit reduces the variation of the offset voltage caused by process mismatches, parasitic resistors, and parasitic capacitances. The chip has been fabricated with a 65 nm 1-poly 6-metal CMOS technology. The effective chip area is 0.87 mm2 and the power consumption is about 110 mW with a 1.2 V power supply. The measured SNDR is about 39.1 dB when the input frequency is 250 MHz at a 1 GHz sampling frequency. The measured SNDR is drastically improved in comparison with the same ADC without any calibration.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.1199/_p
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@ARTICLE{e94-c_7_1199,
author={Daeyun KIM, Minkyu SONG, },
journal={IEICE TRANSACTIONS on Electronics},
title={A 65 nm 1.2 V 7-bit 1 GSPS Folding-Interpolation A/D Converter with a Digitally Self-Calibrated Vector Generator},
year={2011},
volume={E94-C},
number={7},
pages={1199-1205},
abstract={In this paper, a 65 nm 1.2 V 7-bit 1GSPS folding-interpolation A/D converter with a digitally self-calibrated vector generator is proposed. The folding rate is 2 and the interpolation rate is 8. A self-calibrated vector generation circuit with a feedback loop and a recursive digital code inspection is described. The circuit reduces the variation of the offset voltage caused by process mismatches, parasitic resistors, and parasitic capacitances. The chip has been fabricated with a 65 nm 1-poly 6-metal CMOS technology. The effective chip area is 0.87 mm2 and the power consumption is about 110 mW with a 1.2 V power supply. The measured SNDR is about 39.1 dB when the input frequency is 250 MHz at a 1 GHz sampling frequency. The measured SNDR is drastically improved in comparison with the same ADC without any calibration.},
keywords={},
doi={10.1587/transele.E94.C.1199},
ISSN={1745-1353},
month={July},}
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TY - JOUR
TI - A 65 nm 1.2 V 7-bit 1 GSPS Folding-Interpolation A/D Converter with a Digitally Self-Calibrated Vector Generator
T2 - IEICE TRANSACTIONS on Electronics
SP - 1199
EP - 1205
AU - Daeyun KIM
AU - Minkyu SONG
PY - 2011
DO - 10.1587/transele.E94.C.1199
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 2011
AB - In this paper, a 65 nm 1.2 V 7-bit 1GSPS folding-interpolation A/D converter with a digitally self-calibrated vector generator is proposed. The folding rate is 2 and the interpolation rate is 8. A self-calibrated vector generation circuit with a feedback loop and a recursive digital code inspection is described. The circuit reduces the variation of the offset voltage caused by process mismatches, parasitic resistors, and parasitic capacitances. The chip has been fabricated with a 65 nm 1-poly 6-metal CMOS technology. The effective chip area is 0.87 mm2 and the power consumption is about 110 mW with a 1.2 V power supply. The measured SNDR is about 39.1 dB when the input frequency is 250 MHz at a 1 GHz sampling frequency. The measured SNDR is drastically improved in comparison with the same ADC without any calibration.
ER -