Analytical Solution for the Scattering by a Cylinder Perpendicular to the Narrow Walls inside a Rectangular Waveguide and Its Application to εr and μr Measurement

Alfred KIK; Atsuhiro NISHIKATA

doi:10.1587/transele.E95.C.1211

Analytical Solution for the Scattering by a Cylinder Perpendicular to the Narrow Walls inside a Rectangular Waveguide and Its Application to ε_r and μ_r Measurement

Alfred KIK, Atsuhiro NISHIKATA

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In this paper, a new swept-frequency method for the measurement of the complex permittivity and permeability of materials is proposed. The method is based on the S-parameters measurement of a cylindrical material placed inside a rectangular waveguide, where the axis of the cylinder is perpendicular to the narrow waveguide walls. The usage of cylinders in measurement is beneficial because they are easy to fabricate and handle. A novel exact solution of the field scattered by the cylinder is developed. The solution is based on expanding the field in a sum of orthogonal modes in cylindrical coordinates. Excitation coefficients relating the cylindrical scattered field to the waveguide modes are derived, and are used to rigorously formulates the S-parameters. Measurement are performed in the S-band with two dielectric materials (PTFE, nylon), and in the X-band with one magnetic material (ferrite epoxy). The measurement results agree with those from the literature.

Publication: IEICE TRANSACTIONS on Electronics Vol.E95-C No.7 pp.1211-1221

Publication Date: 2012/07/01

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Online ISSN: 1745-1353

DOI: 10.1587/transele.E95.C.1211

Type of Manuscript: Special Section PAPER (Special Section on Recent Trends of Microwave Systems and Their Fundamental Technologies)

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Alfred KIK, Atsuhiro NISHIKATA, "Analytical Solution for the Scattering by a Cylinder Perpendicular to the Narrow Walls inside a Rectangular Waveguide and Its Application to εr and μr Measurement" in IEICE TRANSACTIONS on Electronics, vol. E95-C, no. 7, pp. 1211-1221, July 2012, doi: 10.1587/transele.E95.C.1211.
Abstract: In this paper, a new swept-frequency method for the measurement of the complex permittivity and permeability of materials is proposed. The method is based on the S-parameters measurement of a cylindrical material placed inside a rectangular waveguide, where the axis of the cylinder is perpendicular to the narrow waveguide walls. The usage of cylinders in measurement is beneficial because they are easy to fabricate and handle. A novel exact solution of the field scattered by the cylinder is developed. The solution is based on expanding the field in a sum of orthogonal modes in cylindrical coordinates. Excitation coefficients relating the cylindrical scattered field to the waveguide modes are derived, and are used to rigorously formulates the S-parameters. Measurement are performed in the S-band with two dielectric materials (PTFE, nylon), and in the X-band with one magnetic material (ferrite epoxy). The measurement results agree with those from the literature.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E95.C.1211/_p

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@ARTICLE{e95-c_7_1211,
author={Alfred KIK, Atsuhiro NISHIKATA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analytical Solution for the Scattering by a Cylinder Perpendicular to the Narrow Walls inside a Rectangular Waveguide and Its Application to εr and μr Measurement},
year={2012},
volume={E95-C},
number={7},
pages={1211-1221},
abstract={In this paper, a new swept-frequency method for the measurement of the complex permittivity and permeability of materials is proposed. The method is based on the S-parameters measurement of a cylindrical material placed inside a rectangular waveguide, where the axis of the cylinder is perpendicular to the narrow waveguide walls. The usage of cylinders in measurement is beneficial because they are easy to fabricate and handle. A novel exact solution of the field scattered by the cylinder is developed. The solution is based on expanding the field in a sum of orthogonal modes in cylindrical coordinates. Excitation coefficients relating the cylindrical scattered field to the waveguide modes are derived, and are used to rigorously formulates the S-parameters. Measurement are performed in the S-band with two dielectric materials (PTFE, nylon), and in the X-band with one magnetic material (ferrite epoxy). The measurement results agree with those from the literature.},
keywords={},
doi={10.1587/transele.E95.C.1211},
ISSN={1745-1353},
month={July},}

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TY - JOUR
TI - Analytical Solution for the Scattering by a Cylinder Perpendicular to the Narrow Walls inside a Rectangular Waveguide and Its Application to εr and μr Measurement
T2 - IEICE TRANSACTIONS on Electronics
SP - 1211
EP - 1221
AU - Alfred KIK
AU - Atsuhiro NISHIKATA
PY - 2012
DO - 10.1587/transele.E95.C.1211
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E95-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 2012
AB - In this paper, a new swept-frequency method for the measurement of the complex permittivity and permeability of materials is proposed. The method is based on the S-parameters measurement of a cylindrical material placed inside a rectangular waveguide, where the axis of the cylinder is perpendicular to the narrow waveguide walls. The usage of cylinders in measurement is beneficial because they are easy to fabricate and handle. A novel exact solution of the field scattered by the cylinder is developed. The solution is based on expanding the field in a sum of orthogonal modes in cylindrical coordinates. Excitation coefficients relating the cylindrical scattered field to the waveguide modes are derived, and are used to rigorously formulates the S-parameters. Measurement are performed in the S-band with two dielectric materials (PTFE, nylon), and in the X-band with one magnetic material (ferrite epoxy). The measurement results agree with those from the literature.
ER -