Millimeter-Wave Ellipsometry Using Interface-Planarization Prism

Hiroshi YAMAMOTO; Hiroshi ITO

doi:10.1587/transele.E98.C.873

Millimeter-Wave Ellipsometry Using Interface-Planarization Prism

Hiroshi YAMAMOTO, Hiroshi ITO

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The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements.

Publication: IEICE TRANSACTIONS on Electronics Vol.E98-C No.8 pp.873-877

Publication Date: 2015/08/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1587/transele.E98.C.873

Type of Manuscript: Special Section PAPER (Special Section on Microwave Photonics)

Category: MWP Sensing Technique

Authors

Hiroshi YAMAMOTO
Kitasato University
Hiroshi ITO
Kitasato University

Keyword

ellipsometry, millimeter wave, UTC-PD, biological tissue

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Hiroshi YAMAMOTO, Hiroshi ITO, "Millimeter-Wave Ellipsometry Using Interface-Planarization Prism" in IEICE TRANSACTIONS on Electronics, vol. E98-C, no. 8, pp. 873-877, August 2015, doi: 10.1587/transele.E98.C.873.
Abstract: The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E98.C.873/_p

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@ARTICLE{e98-c_8_873,
author={Hiroshi YAMAMOTO, Hiroshi ITO, },
journal={IEICE TRANSACTIONS on Electronics},
title={Millimeter-Wave Ellipsometry Using Interface-Planarization Prism},
year={2015},
volume={E98-C},
number={8},
pages={873-877},
abstract={The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements.},
keywords={},
doi={10.1587/transele.E98.C.873},
ISSN={1745-1353},
month={August},}

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TY - JOUR
TI - Millimeter-Wave Ellipsometry Using Interface-Planarization Prism
T2 - IEICE TRANSACTIONS on Electronics
SP - 873
EP - 877
AU - Hiroshi YAMAMOTO
AU - Hiroshi ITO
PY - 2015
DO - 10.1587/transele.E98.C.873
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E98-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2015
AB - The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements.
ER -