Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy

Nobuo SATOH; Shigetaka KATORI; Kei KOBAYASHI; Kazumi MATSUSHIGE; Hirofumi YAMADA

doi:10.1587/transele.E98.C.91

Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy

Nobuo SATOH, Shigetaka KATORI, Kei KOBAYASHI, Kazumi MATSUSHIGE, Hirofumi YAMADA

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We have investigated both the film thickness and surface potential of organic semiconductors deposited on two kinds of electrodes by the simultaneous observation with the dynamic force microscopy (DFM)/Kelvin-probe force microscope (KFM). To clarify the interfacial properties of organic semiconductor, we fabricated samples that imitated the organic light emitting diode (OLED) structure by depositing bis [N,N '-(1-naphthyl)-N,N '-phenyl] benzidine (α-NPD) and tris (8-hydroxyquinolinato) aluminum (Alq₃), respectively, on indium-tin-oxide (ITO) as anode and aluminum (Al) as cathode by the vacuum evaporation deposition using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas in the same substrate. The crossover area of the deposited thin films were measured by the DFM/KFM, the energy band diagrams were depicted and we considered that the charge behavior of the organic semiconductor depended on the material and the structure.

Publication: IEICE TRANSACTIONS on Electronics Vol.E98-C No.2 pp.91-97

Publication Date: 2015/02/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1587/transele.E98.C.91

Type of Manuscript: Special Section PAPER (Special Section on Recent Progress in Organic Molecular Electronics)

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Authors

Nobuo SATOH
  Kyoto University, Chiba Institure of Technology
Shigetaka KATORI
  Kyoto University
Kei KOBAYASHI
  Kyoto University
Kazumi MATSUSHIGE
  Kyoto University
Hirofumi YAMADA
  Kyoto University

Keyword

dynamic force microscopy, Kelvin probe force microscopy, metal-shadow-mask deposition, organic light emitting diode

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Nobuo SATOH, Shigetaka KATORI, Kei KOBAYASHI, Kazumi MATSUSHIGE, Hirofumi YAMADA, "Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy" in IEICE TRANSACTIONS on Electronics, vol. E98-C, no. 2, pp. 91-97, February 2015, doi: 10.1587/transele.E98.C.91.
Abstract: We have investigated both the film thickness and surface potential of organic semiconductors deposited on two kinds of electrodes by the simultaneous observation with the dynamic force microscopy (DFM)/Kelvin-probe force microscope (KFM). To clarify the interfacial properties of organic semiconductor, we fabricated samples that imitated the organic light emitting diode (OLED) structure by depositing bis [N,N '-(1-naphthyl)-N,N '-phenyl] benzidine (α-NPD) and tris (8-hydroxyquinolinato) aluminum (Alq₃), respectively, on indium-tin-oxide (ITO) as anode and aluminum (Al) as cathode by the vacuum evaporation deposition using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas in the same substrate. The crossover area of the deposited thin films were measured by the DFM/KFM, the energy band diagrams were depicted and we considered that the charge behavior of the organic semiconductor depended on the material and the structure.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E98.C.91/_p

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@ARTICLE{e98-c_2_91,
author={Nobuo SATOH, Shigetaka KATORI, Kei KOBAYASHI, Kazumi MATSUSHIGE, Hirofumi YAMADA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy},
year={2015},
volume={E98-C},
number={2},
pages={91-97},
abstract={We have investigated both the film thickness and surface potential of organic semiconductors deposited on two kinds of electrodes by the simultaneous observation with the dynamic force microscopy (DFM)/Kelvin-probe force microscope (KFM). To clarify the interfacial properties of organic semiconductor, we fabricated samples that imitated the organic light emitting diode (OLED) structure by depositing bis [N,N '-(1-naphthyl)-N,N '-phenyl] benzidine (α-NPD) and tris (8-hydroxyquinolinato) aluminum (Alq₃), respectively, on indium-tin-oxide (ITO) as anode and aluminum (Al) as cathode by the vacuum evaporation deposition using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas in the same substrate. The crossover area of the deposited thin films were measured by the DFM/KFM, the energy band diagrams were depicted and we considered that the charge behavior of the organic semiconductor depended on the material and the structure.},
keywords={},
doi={10.1587/transele.E98.C.91},
ISSN={1745-1353},
month={February},}

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TY - JOUR
TI - Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy
T2 - IEICE TRANSACTIONS on Electronics
SP - 91
EP - 97
AU - Nobuo SATOH
AU - Shigetaka KATORI
AU - Kei KOBAYASHI
AU - Kazumi MATSUSHIGE
AU - Hirofumi YAMADA
PY - 2015
DO - 10.1587/transele.E98.C.91
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E98-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 2015
AB - We have investigated both the film thickness and surface potential of organic semiconductors deposited on two kinds of electrodes by the simultaneous observation with the dynamic force microscopy (DFM)/Kelvin-probe force microscope (KFM). To clarify the interfacial properties of organic semiconductor, we fabricated samples that imitated the organic light emitting diode (OLED) structure by depositing bis [N,N '-(1-naphthyl)-N,N '-phenyl] benzidine (α-NPD) and tris (8-hydroxyquinolinato) aluminum (Alq₃), respectively, on indium-tin-oxide (ITO) as anode and aluminum (Al) as cathode by the vacuum evaporation deposition using intersecting metal shadow masks. This deposition technique enables us to fabricate four different areas in the same substrate. The crossover area of the deposited thin films were measured by the DFM/KFM, the energy band diagrams were depicted and we considered that the charge behavior of the organic semiconductor depended on the material and the structure.
ER -