This paper describes a new clustering approach for VLSI placement, which is based on a fractal dimension analysis for the topological structure of modules in a logic diagram. A distinctive feature of this approach is that a measure of the 'fractal dimension' has been introduced into a logic diagram in such a way that the clustering of modules is iterated while the fractal dimension among clustered modules is retained in a prescribed range. A part of experimental results is also shown, which demonstrates that our clustering approach raises the placement performance much higher than the conventional clustering methods.
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Masahiko TOYONAGA, Shih-Tsung YANG, Isao SHIRAKAWA, Toshiro AKINO, "A New Approach of Fractal-Analysis Based Module Clustering for VLSI Placement" in IEICE TRANSACTIONS on Fundamentals,
vol. E77-A, no. 12, pp. 2045-2052, December 1994, doi: .
Abstract: This paper describes a new clustering approach for VLSI placement, which is based on a fractal dimension analysis for the topological structure of modules in a logic diagram. A distinctive feature of this approach is that a measure of the 'fractal dimension' has been introduced into a logic diagram in such a way that the clustering of modules is iterated while the fractal dimension among clustered modules is retained in a prescribed range. A part of experimental results is also shown, which demonstrates that our clustering approach raises the placement performance much higher than the conventional clustering methods.
URL: https://globals.ieice.org/en_transactions/fundamentals/10.1587/e77-a_12_2045/_p
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@ARTICLE{e77-a_12_2045,
author={Masahiko TOYONAGA, Shih-Tsung YANG, Isao SHIRAKAWA, Toshiro AKINO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A New Approach of Fractal-Analysis Based Module Clustering for VLSI Placement},
year={1994},
volume={E77-A},
number={12},
pages={2045-2052},
abstract={This paper describes a new clustering approach for VLSI placement, which is based on a fractal dimension analysis for the topological structure of modules in a logic diagram. A distinctive feature of this approach is that a measure of the 'fractal dimension' has been introduced into a logic diagram in such a way that the clustering of modules is iterated while the fractal dimension among clustered modules is retained in a prescribed range. A part of experimental results is also shown, which demonstrates that our clustering approach raises the placement performance much higher than the conventional clustering methods.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - A New Approach of Fractal-Analysis Based Module Clustering for VLSI Placement
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2045
EP - 2052
AU - Masahiko TOYONAGA
AU - Shih-Tsung YANG
AU - Isao SHIRAKAWA
AU - Toshiro AKINO
PY - 1994
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E77-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 1994
AB - This paper describes a new clustering approach for VLSI placement, which is based on a fractal dimension analysis for the topological structure of modules in a logic diagram. A distinctive feature of this approach is that a measure of the 'fractal dimension' has been introduced into a logic diagram in such a way that the clustering of modules is iterated while the fractal dimension among clustered modules is retained in a prescribed range. A part of experimental results is also shown, which demonstrates that our clustering approach raises the placement performance much higher than the conventional clustering methods.
ER -