In this paper we study on the stability of an operating points of a nonlinear resistive circuits including transistors. A set of sufficient conditions for the operating point to be unstable are proposed. These conditions are a generalization of the well-known negative difference resistance (NDR) criteria.
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Tetsuo NISHI, Masato OGATA, "On the Stability of Operating Points of Transistor Circuits" in IEICE TRANSACTIONS on Fundamentals,
vol. E80-A, no. 9, pp. 1540-1547, September 1997, doi: .
Abstract: In this paper we study on the stability of an operating points of a nonlinear resistive circuits including transistors. A set of sufficient conditions for the operating point to be unstable are proposed. These conditions are a generalization of the well-known negative difference resistance (NDR) criteria.
URL: https://globals.ieice.org/en_transactions/fundamentals/10.1587/e80-a_9_1540/_p
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@ARTICLE{e80-a_9_1540,
author={Tetsuo NISHI, Masato OGATA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={On the Stability of Operating Points of Transistor Circuits},
year={1997},
volume={E80-A},
number={9},
pages={1540-1547},
abstract={In this paper we study on the stability of an operating points of a nonlinear resistive circuits including transistors. A set of sufficient conditions for the operating point to be unstable are proposed. These conditions are a generalization of the well-known negative difference resistance (NDR) criteria.},
keywords={},
doi={},
ISSN={},
month={September},}
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TY - JOUR
TI - On the Stability of Operating Points of Transistor Circuits
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1540
EP - 1547
AU - Tetsuo NISHI
AU - Masato OGATA
PY - 1997
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E80-A
IS - 9
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - September 1997
AB - In this paper we study on the stability of an operating points of a nonlinear resistive circuits including transistors. A set of sufficient conditions for the operating point to be unstable are proposed. These conditions are a generalization of the well-known negative difference resistance (NDR) criteria.
ER -