Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines

Hiroyuki YOTSUYANAGI; Kotaro ISE; Masaki HASHIZUME; Yoshinobu HIGAMI; Hiroshi TAKAHASHI

doi:10.1587/transfun.E100.A.2842

Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines

Hiroyuki YOTSUYANAGI, Kotaro ISE, Masaki HASHIZUME, Yoshinobu HIGAMI, Hiroshi TAKAHASHI

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Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.

Publication: IEICE TRANSACTIONS on Fundamentals Vol.E100-A No.12 pp.2842-2850

Publication Date: 2017/12/01

Publicized

Online ISSN: 1745-1337

DOI: 10.1587/transfun.E100.A.2842

Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)

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Authors

Hiroyuki YOTSUYANAGI
  Tokushima University
Kotaro ISE
  Tokushima University
Masaki HASHIZUME
  Tokushima University
Yoshinobu HIGAMI
  Ehime University
Hiroshi TAKAHASHI
  Ehime University

Keyword

resistive open, small delay fault, adjacent line, delay variation, anomaly detection

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Hiroyuki YOTSUYANAGI, Kotaro ISE, Masaki HASHIZUME, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, "Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines" in IEICE TRANSACTIONS on Fundamentals, vol. E100-A, no. 12, pp. 2842-2850, December 2017, doi: 10.1587/transfun.E100.A.2842.
Abstract: Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.
URL: https://globals.ieice.org/en_transactions/fundamentals/10.1587/transfun.E100.A.2842/_p

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@ARTICLE{e100-a_12_2842,
author={Hiroyuki YOTSUYANAGI, Kotaro ISE, Masaki HASHIZUME, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines},
year={2017},
volume={E100-A},
number={12},
pages={2842-2850},
abstract={Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.},
keywords={},
doi={10.1587/transfun.E100.A.2842},
ISSN={1745-1337},
month={December},}

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TY - JOUR
TI - Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2842
EP - 2850
AU - Hiroyuki YOTSUYANAGI
AU - Kotaro ISE
AU - Masaki HASHIZUME
AU - Yoshinobu HIGAMI
AU - Hiroshi TAKAHASHI
PY - 2017
DO - 10.1587/transfun.E100.A.2842
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E100-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2017
AB - Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation.
ER -