X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability

Gang ZENG; Hideo ITO

doi:10.1093/ietisy/e88-d.7.1662

X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability

Gang ZENG, Hideo ITO

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In this paper, a complete X-tolerant test data compression solution is proposed for system-on-a-chip (SOC) testing. The solution achieves low-cost testing by employing not only selective Huffman vertical coding (SHVC) for test stimulus compression but also MISR-based time compactor for test response compaction. Moreover, the solution is non-intrusive, since it can tolerate any number of unknown states (also called X state) in test responses such that it does not require modifying the logic of core to eliminate or block the sources of unknown states. Furthermore, the solution achieves enhanced diagnosis capability over conventional MISR. The enhanced diagnosis requires the least hardware overhead by reusing the existing masking logic and achieves significant saving in diagnostic time. Experimental results for ISCAS 89 benchmarks as well as the evaluation of hardware implementation have proven the efficiency of the proposed test solution.

Publication: IEICE TRANSACTIONS on Information Vol.E88-D No.7 pp.1662-1670

Publication Date: 2005/07/01

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DOI: 10.1093/ietisy/e88-d.7.1662

Type of Manuscript: PAPER

Category: Dependable Computing

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Gang ZENG, Hideo ITO, "X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability" in IEICE TRANSACTIONS on Information, vol. E88-D, no. 7, pp. 1662-1670, July 2005, doi: 10.1093/ietisy/e88-d.7.1662.
Abstract: In this paper, a complete X-tolerant test data compression solution is proposed for system-on-a-chip (SOC) testing. The solution achieves low-cost testing by employing not only selective Huffman vertical coding (SHVC) for test stimulus compression but also MISR-based time compactor for test response compaction. Moreover, the solution is non-intrusive, since it can tolerate any number of unknown states (also called X state) in test responses such that it does not require modifying the logic of core to eliminate or block the sources of unknown states. Furthermore, the solution achieves enhanced diagnosis capability over conventional MISR. The enhanced diagnosis requires the least hardware overhead by reusing the existing masking logic and achieves significant saving in diagnostic time. Experimental results for ISCAS 89 benchmarks as well as the evaluation of hardware implementation have proven the efficiency of the proposed test solution.
URL: https://globals.ieice.org/en_transactions/information/10.1093/ietisy/e88-d.7.1662/_p

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@ARTICLE{e88-d_7_1662,
author={Gang ZENG, Hideo ITO, },
journal={IEICE TRANSACTIONS on Information},
title={X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability},
year={2005},
volume={E88-D},
number={7},
pages={1662-1670},
abstract={In this paper, a complete X-tolerant test data compression solution is proposed for system-on-a-chip (SOC) testing. The solution achieves low-cost testing by employing not only selective Huffman vertical coding (SHVC) for test stimulus compression but also MISR-based time compactor for test response compaction. Moreover, the solution is non-intrusive, since it can tolerate any number of unknown states (also called X state) in test responses such that it does not require modifying the logic of core to eliminate or block the sources of unknown states. Furthermore, the solution achieves enhanced diagnosis capability over conventional MISR. The enhanced diagnosis requires the least hardware overhead by reusing the existing masking logic and achieves significant saving in diagnostic time. Experimental results for ISCAS 89 benchmarks as well as the evaluation of hardware implementation have proven the efficiency of the proposed test solution.},
keywords={},
doi={10.1093/ietisy/e88-d.7.1662},
ISSN={},
month={July},}

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TY - JOUR
TI - X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability
T2 - IEICE TRANSACTIONS on Information
SP - 1662
EP - 1670
AU - Gang ZENG
AU - Hideo ITO
PY - 2005
DO - 10.1093/ietisy/e88-d.7.1662
JO - IEICE TRANSACTIONS on Information
SN -
VL - E88-D
IS - 7
JA - IEICE TRANSACTIONS on Information
Y1 - July 2005
AB - In this paper, a complete X-tolerant test data compression solution is proposed for system-on-a-chip (SOC) testing. The solution achieves low-cost testing by employing not only selective Huffman vertical coding (SHVC) for test stimulus compression but also MISR-based time compactor for test response compaction. Moreover, the solution is non-intrusive, since it can tolerate any number of unknown states (also called X state) in test responses such that it does not require modifying the logic of core to eliminate or block the sources of unknown states. Furthermore, the solution achieves enhanced diagnosis capability over conventional MISR. The enhanced diagnosis requires the least hardware overhead by reusing the existing masking logic and achieves significant saving in diagnostic time. Experimental results for ISCAS 89 benchmarks as well as the evaluation of hardware implementation have proven the efficiency of the proposed test solution.
ER -