Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree

Gang ZENG; Hideo ITO

doi:10.1093/ietisy/e89-d.3.1157

Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree

Gang ZENG, Hideo ITO

Full Text Views

0

Share
Cite this

Summary :

A novel concurrent core test approach is proposed to reduce the test cost of SOC. Prior to test, the test sets corresponding to cores under test (CUT) are merged by using the proposed merging algorithm to obtain a minimum merged test set. During test, the proposed scan tree architecture is employed to support the concurrent core test using the merged test set. The approach achieves concurrent core test with one scan input and low hardware overhead. Moreover, the approach does not need any additional test generation, and it can be used in conjunction with general compression/decompression techniques to further reduce test cost. Experimental results for ISCAS 89 benchmarks have proven the efficiency of the proposed approach.

Publication: IEICE TRANSACTIONS on Information Vol.E89-D No.3 pp.1157-1164

Publication Date: 2006/03/01

Publicized

Online ISSN: 1745-1361

DOI: 10.1093/ietisy/e89-d.3.1157

Type of Manuscript: PAPER

Category: Dependable Computing

Cite this

Copy

Gang ZENG, Hideo ITO, "Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree" in IEICE TRANSACTIONS on Information, vol. E89-D, no. 3, pp. 1157-1164, March 2006, doi: 10.1093/ietisy/e89-d.3.1157.
Abstract: A novel concurrent core test approach is proposed to reduce the test cost of SOC. Prior to test, the test sets corresponding to cores under test (CUT) are merged by using the proposed merging algorithm to obtain a minimum merged test set. During test, the proposed scan tree architecture is employed to support the concurrent core test using the merged test set. The approach achieves concurrent core test with one scan input and low hardware overhead. Moreover, the approach does not need any additional test generation, and it can be used in conjunction with general compression/decompression techniques to further reduce test cost. Experimental results for ISCAS 89 benchmarks have proven the efficiency of the proposed approach.
URL: https://globals.ieice.org/en_transactions/information/10.1093/ietisy/e89-d.3.1157/_p

Copy

@ARTICLE{e89-d_3_1157,
author={Gang ZENG, Hideo ITO, },
journal={IEICE TRANSACTIONS on Information},
title={Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree},
year={2006},
volume={E89-D},
number={3},
pages={1157-1164},
abstract={A novel concurrent core test approach is proposed to reduce the test cost of SOC. Prior to test, the test sets corresponding to cores under test (CUT) are merged by using the proposed merging algorithm to obtain a minimum merged test set. During test, the proposed scan tree architecture is employed to support the concurrent core test using the merged test set. The approach achieves concurrent core test with one scan input and low hardware overhead. Moreover, the approach does not need any additional test generation, and it can be used in conjunction with general compression/decompression techniques to further reduce test cost. Experimental results for ISCAS 89 benchmarks have proven the efficiency of the proposed approach.},
keywords={},
doi={10.1093/ietisy/e89-d.3.1157},
ISSN={1745-1361},
month={March},}

Copy

TY - JOUR
TI - Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree
T2 - IEICE TRANSACTIONS on Information
SP - 1157
EP - 1164
AU - Gang ZENG
AU - Hideo ITO
PY - 2006
DO - 10.1093/ietisy/e89-d.3.1157
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E89-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2006
AB - A novel concurrent core test approach is proposed to reduce the test cost of SOC. Prior to test, the test sets corresponding to cores under test (CUT) are merged by using the proposed merging algorithm to obtain a minimum merged test set. During test, the proposed scan tree architecture is employed to support the concurrent core test using the merged test set. The approach achieves concurrent core test with one scan input and low hardware overhead. Moreover, the approach does not need any additional test generation, and it can be used in conjunction with general compression/decompression techniques to further reduce test cost. Experimental results for ISCAS 89 benchmarks have proven the efficiency of the proposed approach.
ER -