Guided-Probe Diagnosis of LSIs Containing Macrocells

Norio KUJI; Tadao TAKEDA

Guided-Probe Diagnosis of LSIs Containing Macrocells

Norio KUJI, Tadao TAKEDA

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A novel method for the guided-probe diagnosis of high-performance LSIs containing macrocells, which have no internal netlist essential to the diagnosis, has been developed. In this method, the macrocell netlist is derived from its layout by extracting a leaf-cell-level netlist and is combined with the original one. Logic models for the leaf cells in the extracted netlist are also generated to obtain the logic-simulation data in the macrocells. The logic modeling is extended for application to memory macrocells, based on the idea that analog-behavior leaf cells in the memory macrocells are converted into logically equivalent circuits for logic simulation. Specifically, sense amplifiers and wired-or connections on bit lines are replaced with the corresponding logic-behavior models. The proposed method has been successfully applied to actual design data of LSIs containing macrocells, and it has been verified that it enables fault paths inside macrocells to be accurately traced and that the logic models give good timing resolution in the logic simulation. Using the proposed method, LSIs containing macrocells will be able to be diagnosed regardless of the macrocell types, without the need for a "golden" device, by an electron-beam guided probe system.

Publication: IEICE TRANSACTIONS on Information Vol.E81-D No.7 pp.731-737

Publication Date: 1998/07/25

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Type of Manuscript: Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)

Category: Beam Testing/Diagnosis

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Norio KUJI, Tadao TAKEDA, "Guided-Probe Diagnosis of LSIs Containing Macrocells" in IEICE TRANSACTIONS on Information, vol. E81-D, no. 7, pp. 731-737, July 1998, doi: .
Abstract: A novel method for the guided-probe diagnosis of high-performance LSIs containing macrocells, which have no internal netlist essential to the diagnosis, has been developed. In this method, the macrocell netlist is derived from its layout by extracting a leaf-cell-level netlist and is combined with the original one. Logic models for the leaf cells in the extracted netlist are also generated to obtain the logic-simulation data in the macrocells. The logic modeling is extended for application to memory macrocells, based on the idea that analog-behavior leaf cells in the memory macrocells are converted into logically equivalent circuits for logic simulation. Specifically, sense amplifiers and wired-or connections on bit lines are replaced with the corresponding logic-behavior models. The proposed method has been successfully applied to actual design data of LSIs containing macrocells, and it has been verified that it enables fault paths inside macrocells to be accurately traced and that the logic models give good timing resolution in the logic simulation. Using the proposed method, LSIs containing macrocells will be able to be diagnosed regardless of the macrocell types, without the need for a "golden" device, by an electron-beam guided probe system.
URL: https://globals.ieice.org/en_transactions/information/10.1587/e81-d_7_731/_p

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@ARTICLE{e81-d_7_731,
author={Norio KUJI, Tadao TAKEDA, },
journal={IEICE TRANSACTIONS on Information},
title={Guided-Probe Diagnosis of LSIs Containing Macrocells},
year={1998},
volume={E81-D},
number={7},
pages={731-737},
abstract={A novel method for the guided-probe diagnosis of high-performance LSIs containing macrocells, which have no internal netlist essential to the diagnosis, has been developed. In this method, the macrocell netlist is derived from its layout by extracting a leaf-cell-level netlist and is combined with the original one. Logic models for the leaf cells in the extracted netlist are also generated to obtain the logic-simulation data in the macrocells. The logic modeling is extended for application to memory macrocells, based on the idea that analog-behavior leaf cells in the memory macrocells are converted into logically equivalent circuits for logic simulation. Specifically, sense amplifiers and wired-or connections on bit lines are replaced with the corresponding logic-behavior models. The proposed method has been successfully applied to actual design data of LSIs containing macrocells, and it has been verified that it enables fault paths inside macrocells to be accurately traced and that the logic models give good timing resolution in the logic simulation. Using the proposed method, LSIs containing macrocells will be able to be diagnosed regardless of the macrocell types, without the need for a "golden" device, by an electron-beam guided probe system.},
keywords={},
doi={},
ISSN={},
month={July},}

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TY - JOUR
TI - Guided-Probe Diagnosis of LSIs Containing Macrocells
T2 - IEICE TRANSACTIONS on Information
SP - 731
EP - 737
AU - Norio KUJI
AU - Tadao TAKEDA
PY - 1998
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E81-D
IS - 7
JA - IEICE TRANSACTIONS on Information
Y1 - July 1998
AB - A novel method for the guided-probe diagnosis of high-performance LSIs containing macrocells, which have no internal netlist essential to the diagnosis, has been developed. In this method, the macrocell netlist is derived from its layout by extracting a leaf-cell-level netlist and is combined with the original one. Logic models for the leaf cells in the extracted netlist are also generated to obtain the logic-simulation data in the macrocells. The logic modeling is extended for application to memory macrocells, based on the idea that analog-behavior leaf cells in the memory macrocells are converted into logically equivalent circuits for logic simulation. Specifically, sense amplifiers and wired-or connections on bit lines are replaced with the corresponding logic-behavior models. The proposed method has been successfully applied to actual design data of LSIs containing macrocells, and it has been verified that it enables fault paths inside macrocells to be accurately traced and that the logic models give good timing resolution in the logic simulation. Using the proposed method, LSIs containing macrocells will be able to be diagnosed regardless of the macrocell types, without the need for a "golden" device, by an electron-beam guided probe system.
ER -