Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices

Toshihiro KAMEDA; Hiroaki KONOURA; Dawood ALNAJJAR; Yukio MITSUYAMA; Masanori HASHIMOTO; Takao ONOYE

doi:10.1587/transinf.E96.D.1624

Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices

Toshihiro KAMEDA, Hiroaki KONOURA, Dawood ALNAJJAR, Yukio MITSUYAMA, Masanori HASHIMOTO, Takao ONOYE

Full Text Views

0

Share
Cite this

Summary :

This paper proposes a procedure for avoiding delay faults in field with slack assessment during standby time. The proposed procedure performs path delay testing and checks if the slack is larger than a threshold value using selectable delay embedded in basic elements (BE). If the slack is smaller than the threshold, a pair of BEs to be replaced, which maximizes the path slack, is identified. Experimental results with two application circuits mapped on a coarse-grained architecture show that for aging-induced delay degradation a small threshold slack, which is less than 1 ps in a test case, is enough to ensure the delay fault prediction.

Publication: IEICE TRANSACTIONS on Information Vol.E96-D No.8 pp.1624-1631

Publication Date: 2013/08/01

Publicized

Online ISSN: 1745-1361

DOI: 10.1587/transinf.E96.D.1624

Type of Manuscript: Special Section PAPER (Special Section on Reconfigurable Systems)

Category: Test and Verification

Authors

Toshihiro KAMEDA
  Osaka University
Hiroaki KONOURA
  Osaka University
Dawood ALNAJJAR
  Osaka University
Yukio MITSUYAMA
  Kochi University of Technology
Masanori HASHIMOTO
  Osaka University
Takao ONOYE
  Osaka University

Keyword

field test, fault avoidance, coarse-grained reconfigurable device

Cite this

Copy

Toshihiro KAMEDA, Hiroaki KONOURA, Dawood ALNAJJAR, Yukio MITSUYAMA, Masanori HASHIMOTO, Takao ONOYE, "Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices" in IEICE TRANSACTIONS on Information, vol. E96-D, no. 8, pp. 1624-1631, August 2013, doi: 10.1587/transinf.E96.D.1624.
Abstract: This paper proposes a procedure for avoiding delay faults in field with slack assessment during standby time. The proposed procedure performs path delay testing and checks if the slack is larger than a threshold value using selectable delay embedded in basic elements (BE). If the slack is smaller than the threshold, a pair of BEs to be replaced, which maximizes the path slack, is identified. Experimental results with two application circuits mapped on a coarse-grained architecture show that for aging-induced delay degradation a small threshold slack, which is less than 1 ps in a test case, is enough to ensure the delay fault prediction.
URL: https://globals.ieice.org/en_transactions/information/10.1587/transinf.E96.D.1624/_p

Copy

@ARTICLE{e96-d_8_1624,
author={Toshihiro KAMEDA, Hiroaki KONOURA, Dawood ALNAJJAR, Yukio MITSUYAMA, Masanori HASHIMOTO, Takao ONOYE, },
journal={IEICE TRANSACTIONS on Information},
title={Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices},
year={2013},
volume={E96-D},
number={8},
pages={1624-1631},
abstract={This paper proposes a procedure for avoiding delay faults in field with slack assessment during standby time. The proposed procedure performs path delay testing and checks if the slack is larger than a threshold value using selectable delay embedded in basic elements (BE). If the slack is smaller than the threshold, a pair of BEs to be replaced, which maximizes the path slack, is identified. Experimental results with two application circuits mapped on a coarse-grained architecture show that for aging-induced delay degradation a small threshold slack, which is less than 1 ps in a test case, is enough to ensure the delay fault prediction.},
keywords={},
doi={10.1587/transinf.E96.D.1624},
ISSN={1745-1361},
month={August},}

Copy

TY - JOUR
TI - Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
T2 - IEICE TRANSACTIONS on Information
SP - 1624
EP - 1631
AU - Toshihiro KAMEDA
AU - Hiroaki KONOURA
AU - Dawood ALNAJJAR
AU - Yukio MITSUYAMA
AU - Masanori HASHIMOTO
AU - Takao ONOYE
PY - 2013
DO - 10.1587/transinf.E96.D.1624
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E96-D
IS - 8
JA - IEICE TRANSACTIONS on Information
Y1 - August 2013
AB - This paper proposes a procedure for avoiding delay faults in field with slack assessment during standby time. The proposed procedure performs path delay testing and checks if the slack is larger than a threshold value using selectable delay embedded in basic elements (BE). If the slack is smaller than the threshold, a pair of BEs to be replaced, which maximizes the path slack, is identified. Experimental results with two application circuits mapped on a coarse-grained architecture show that for aging-induced delay degradation a small threshold slack, which is less than 1 ps in a test case, is enough to ensure the delay fault prediction.
ER -