Influence of Induced Noise Caused by Breaking Electric Contacts on Digital Circuits

Keiichi UCHIMURA; Junji MICHIDA; Shinji NOZU; Teizo AIDA; Hiroshi ECHIGO; Tasuku TAKAGI

Influence of Induced Noise Caused by Breaking Electric Contacts on Digital Circuits

Keiichi UCHIMURA, Junji MICHIDA, Shinji NOZU, Teizo AIDA, Hiroshi ECHIGO, Tasuku TAKAGI

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This letter deals with a newly developed automatic system, which measures the rate of malfunction of digital circuits owing to noise induced by breaking electric contacts. In this system, a personal computer is used for the detection and the count of the malfunction in the digital circuit. Its experimental results are reported here.

Publication: IEICE TRANSACTIONS on transactions Vol.E70-E No.4 pp.370-372

Publication Date: 1987/04/25

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Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1987 National Convention IEICE)

Category: Instrumentation and Electronic Circuits

Authors

Keiichi UCHIMURA
Junji MICHIDA
Shinji NOZU
Teizo AIDA
Hiroshi ECHIGO
Tasuku TAKAGI

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Keiichi UCHIMURA, Junji MICHIDA, Shinji NOZU, Teizo AIDA, Hiroshi ECHIGO, Tasuku TAKAGI, "Influence of Induced Noise Caused by Breaking Electric Contacts on Digital Circuits" in IEICE TRANSACTIONS on transactions, vol. E70-E, no. 4, pp. 370-372, April 1987, doi: .
Abstract: This letter deals with a newly developed automatic system, which measures the rate of malfunction of digital circuits owing to noise induced by breaking electric contacts. In this system, a personal computer is used for the detection and the count of the malfunction in the digital circuit. Its experimental results are reported here.
URL: https://globals.ieice.org/en_transactions/transactions/10.1587/e70-e_4_370/_p

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@ARTICLE{e70-e_4_370,
author={Keiichi UCHIMURA, Junji MICHIDA, Shinji NOZU, Teizo AIDA, Hiroshi ECHIGO, Tasuku TAKAGI, },
journal={IEICE TRANSACTIONS on transactions},
title={Influence of Induced Noise Caused by Breaking Electric Contacts on Digital Circuits},
year={1987},
volume={E70-E},
number={4},
pages={370-372},
abstract={This letter deals with a newly developed automatic system, which measures the rate of malfunction of digital circuits owing to noise induced by breaking electric contacts. In this system, a personal computer is used for the detection and the count of the malfunction in the digital circuit. Its experimental results are reported here.},
keywords={},
doi={},
ISSN={},
month={April},}

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TY - JOUR
TI - Influence of Induced Noise Caused by Breaking Electric Contacts on Digital Circuits
T2 - IEICE TRANSACTIONS on transactions
SP - 370
EP - 372
AU - Keiichi UCHIMURA
AU - Junji MICHIDA
AU - Shinji NOZU
AU - Teizo AIDA
AU - Hiroshi ECHIGO
AU - Tasuku TAKAGI
PY - 1987
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E70-E
IS - 4
JA - IEICE TRANSACTIONS on transactions
Y1 - April 1987
AB - This letter deals with a newly developed automatic system, which measures the rate of malfunction of digital circuits owing to noise induced by breaking electric contacts. In this system, a personal computer is used for the detection and the count of the malfunction in the digital circuit. Its experimental results are reported here.
ER -