Michelson Interferometric Measurement of Frequency Deviation of a Directly Modulated Semiconductor Laser

Masaaki IMAI; Koji KAWAKITA; Yoshihiro OHTSUKA

Michelson Interferometric Measurement of Frequency Deviation of a Directly Modulated Semiconductor Laser

Masaaki IMAI, Koji KAWAKITA, Yoshihiro OHTSUKA

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An interferometric method for measuring frequency deviation of semiconductor lasers in wide range of modulation frequencies has been developed. Fringe visibilities of an interfered IM- and FM-modulated light depend on frequency deviation, time delay difference and intensity modulation depth. The applicability of this method has been also discussed.

Publication: IEICE TRANSACTIONS on transactions Vol.E71-E No.4 pp.345-347

Publication Date: 1988/04/25

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Type of Manuscript: Special Section LETTER (Special Issue: Papers from 1988 Spring Convention IEICE)

Category: Optical Measurement

Authors

Masaaki IMAI
Koji KAWAKITA
Yoshihiro OHTSUKA

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Masaaki IMAI, Koji KAWAKITA, Yoshihiro OHTSUKA, "Michelson Interferometric Measurement of Frequency Deviation of a Directly Modulated Semiconductor Laser" in IEICE TRANSACTIONS on transactions, vol. E71-E, no. 4, pp. 345-347, April 1988, doi: .
Abstract: An interferometric method for measuring frequency deviation of semiconductor lasers in wide range of modulation frequencies has been developed. Fringe visibilities of an interfered IM- and FM-modulated light depend on frequency deviation, time delay difference and intensity modulation depth. The applicability of this method has been also discussed.
URL: https://globals.ieice.org/en_transactions/transactions/10.1587/e71-e_4_345/_p

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@ARTICLE{e71-e_4_345,
author={Masaaki IMAI, Koji KAWAKITA, Yoshihiro OHTSUKA, },
journal={IEICE TRANSACTIONS on transactions},
title={Michelson Interferometric Measurement of Frequency Deviation of a Directly Modulated Semiconductor Laser},
year={1988},
volume={E71-E},
number={4},
pages={345-347},
abstract={An interferometric method for measuring frequency deviation of semiconductor lasers in wide range of modulation frequencies has been developed. Fringe visibilities of an interfered IM- and FM-modulated light depend on frequency deviation, time delay difference and intensity modulation depth. The applicability of this method has been also discussed.},
keywords={},
doi={},
ISSN={},
month={April},}

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TY - JOUR
TI - Michelson Interferometric Measurement of Frequency Deviation of a Directly Modulated Semiconductor Laser
T2 - IEICE TRANSACTIONS on transactions
SP - 345
EP - 347
AU - Masaaki IMAI
AU - Koji KAWAKITA
AU - Yoshihiro OHTSUKA
PY - 1988
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E71-E
IS - 4
JA - IEICE TRANSACTIONS on transactions
Y1 - April 1988
AB - An interferometric method for measuring frequency deviation of semiconductor lasers in wide range of modulation frequencies has been developed. Fringe visibilities of an interfered IM- and FM-modulated light depend on frequency deviation, time delay difference and intensity modulation depth. The applicability of this method has been also discussed.
ER -