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[Author] Atsushi SAKAI(2hit)

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  • Routing Methodology for Minimizing Crosstalk in SoC

    Takashi YAMADA  Atsushi SAKAI  Yoshifumi MATSUSHITA  Hiroto YASUURA  

     
    PAPER-VLSI Design Technology and CAD

      Vol:
    E86-A No:9
      Page(s):
    2347-2356

    In this paper, we propose new physical design techniques to reduce crosstalk noise and crosstalk-induced delay variations caused in a nanometer-scale system-on-a-chip (SoC). We have almost eliminated the coupling effect between signal wires by simply optimizing parameters for the automatic place and route methodology. Our approach consists of two techniques, (1) A 3-D optimization technique for tuning the routing grid configuration both in the horizontal and vertical directions. (2) A co-optimization technique for tuning the cell utilization ratio and the routing grid simultaneously. Experiments on the design of an image processing circuit fabricated in a 0.13 µm CMOS process with six layers of copper interconnect show that crosstalk noise is almost eliminated. From the results of a static timing analysis considering the worst-case crosstalk condition, the longest path delay is decreased by about 15% maximum if technique (1) is used, and by about 7% maximum if technique (2) is used. The 7-15% delay reduction has been achieved without process improvement, and this reduction corresponds to between 1/4 and 1/2 generation of process progress.

  • Low Loss Ultra-Small Branches in a Silicon Photonic Wire Waveguide

    Atsushi SAKAI  Tatsuhiko FUKAZAWA  Toshihiko BABA  

     
    PAPER-New Devices

      Vol:
    E85-C No:4
      Page(s):
    1033-1038

    We theoretically and experimentally demonstrate low loss branches in a Si photonic wire waveguide. Approximate calculation by the two-dimensional finite-difference time-domain (2-D FDTD) method and detailed design by the 3-D FDTD method indicate that low excess loss less than 0.2 dB is expected for a µm-size bend-waveguide-type branch at a wavelength of 1.55 µm. This branch is fabricated in a silicon-on-insulator substrate and the loss is evaluated to be 0.3 dB. This value is small enough to construct a very compact branching circuit.

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