A rapid single-flux-quantum (RSFQ) truncated multiplier based on bit-level processing is proposed. In the multiplier, two operands are transformed to two serialized patterns of bits (pulses), and the multiplication is carried out by processing those bits. The result is obtained by counting bits. By calculating in bit-level, the proposed multiplier can be implemented in small area. The gate level design of the multiplier is shown. The layout of the 4-bit multiplier was also designed.

A C-testable 4-2 adder tree for an easily testable high-speed multiplier is proposed, and a recursive method for test generation is shown. By using the specific patterns that we call 'alternately inverted patterns,' the adder tree, as well as partial product generators, can be tested with 14 patterns regardless of its operand size under the cell fault model. The test patterns are easily fed through the partial product generators. The hardware overhead of the 4-2 adder tree with partial product generators for a 64-bit multiplier is about 15%. By using a previously proposed easily testable adder as the final adder, we can obtain an easily testable high-speed multiplier.

We propose a C-testable multiple-block carry select adder with respect to the cell fault model. Full adders and 2:1 multiplexers are considered as cells. By an additional external input, we obtain a C-testable carry select adder. We only modify the least significant position of each block. The adder is testable with a test set consisting of 16 patterns regardless of the size of each block and the number of blocks. This is the minimum test set for the adder. We show two gate-level implementations of the adder which are testable with a test set of 9 patterns and 7 patterns respectively, with respect to the single stuck-at fault model.

A floating-point multiplier with concurrent error detection capability by partial duplication is proposed. It uses a truncated multiplier for checking of the significand (mantissa) multiplication instead of full duplication. The proposed multiplier can detect any erroneous output with error larger than one unit in the last place (1 ulp) of the significand, which may be overlooked by residue checking. Its circuit area is smaller than that of a fully duplicated one. Area overhead of a single-precision multiplier is about 78% and that of a double-precision one is about 65%.

Superconducting Single-Flux-Quantum (SFQ) devices have been paid much attention as alternative devices for digital circuits, because of their high switching speed and low power consumption. For large-scale circuit design, the role of computer-aided design environment is significant. As the characteristics of the SFQ devices are different from conventional devices, a new design environment is required. In this paper, we propose a new timing-aware circuit description method which can be used for SFQ circuit design. Based on the description and the dedicated algorithms we have been developing for SFQ logic circuit design, we propose an integrated design flow for SFQ logic circuits. We have designed a circuit using our developed design tools along with the design flow and demonstrated the correct operation.

We propose a low-overhead fault-secure parallel prefix adder. We duplicate carry bits for checking purposes. Only one half of normal carry bits are compared with the corresponding redundant carry bits, and the hardware overhead of the adder is low. For concurrent error detection, we also predict the parity of the result. The adder uses parity-based error detection and it has high compatibility with systems that have parity-based error detection. We can implement various fault-secure parallel prefix adders such as Sklansky adder, Brent-Kung adder, Han-Carlson adder, and Kogge-Stone adder. The area overhead of the proposed adder is about 15% lower than that of a previously proposed adder that compares all the carry bits.