This paper reviews techniques for digitally assisted pipeline ADCs. Errors of pipeline ADCs originated by capacitor mismatch, finite amplifier gain, incomplete settling and offset can be corrected in digital-domain foreground or background calibrations. In foreground calibrations, the errors are measured by reconfiguration of the building blocks of pipeline ADC or using an INL plot without reconfiguration. In background calibrations, the errors are measured with random signal and continuously corrected while simultaneously performing the normal A/D conversions. Techniques for measuring and correcting the errors at foreground and background are reviewed and a unified approach to the description of the principle of background calibration of gain errors is presented.

This paper reviews architectures and topologies for column-parallel analog-to-digital converters (ADCs) used for CMOS image sensors (CISs) and discusses the performance of CISs using column-parallel ADCs based on figures-of-merit (FoM) with considering noise models which behave differently at low/middle and high pixel-rate regions. Various FoM considering different performance factors are defined. The defined FoM are applied to surveyed data on reported CISs using column-parallel ADCs which are categorized into 4 types; single slope, SAR, cyclic and delta-sigma ADCs. The FoM defined by (noise)2(power)/(pixel-rate) separately for low/middle and high pixel-rate regions well explains the frontline of the CIS' performance in all the pixel rates. Using the FoM defined by (noise)2(power)/(intrascene dynamic range)(pixel-rate), the effectiveness of recently-reported techniques for extended-dynamic-range CISs is clarified.

In this paper, low-power design techniques of high-speed A/D converters are reviewed and discussed. Pipeline and parallel-pipeline architectures are treated as these are dominant architectures when required high sampling rate and high resolution with reasonable power dissipation. A systematic approach to the power optimization of pipeline and parallel pipeline ADC's is introduced based on models of noise analysis and response time of a building block in the multiple-stage pipeline ADC. Finally, the theoretical minimum of required power as functions of the sampling rate, resolution and SNR is discussed. The analysis shows that, with the developments of new circuits and systems to approach to the minimum, the power can be further reduced by a factor of more than 1/10 without changing the basic architectures.

This paper presents a high-NIR sensitivity SOI-gate lock-in pixel with improved modulation contrast. The proposed pixel has a shallow buried channel and intermediate gates to create both a high lateral electric field and a potential barrier to parasitic light sensitivity. Device simulation results showed that parasitic light sensitivity reduced from 13.7% to 0.13% compared to the previous structure.

Time-of-flight (TOF) range imaging is a promising technology for various applications such as touchless control, augmented reality interface, and automotive. The TOF range imagers are classified into two methods: direct TOF with single photo avalanche diodes and indirect TOF with lock-in pixels. The indirect TOF range imagers have advantages in terms of a high spatial resolution and high depth precision because their pixels are simple and can handle many photons at one time. This paper reviews and discusses principal lock-in pixels reported both in the past and present, including circuit-based and charge-modulator-based lock-in pixels. In addition, key technologies that include enhancing sensitivity and background suppression techniques are also discussed.

This paper presents a novel method of an on-sensor motion vector estimation. One of the key techniques is an iterative block matching algorithm using high-speed interpolated pictures. This technique allows us to estimate the video-rate (30 frame/s) motion vectors accurately from the motion vectors obtained at high-speed frames. The proposed iterative block matching reduces the computational complexity by a factor of more than one tenth compared to the conventional full search block matching algorithm. This property is particularly useful for the reduction of the power dissipation of video encoder. Another proposed technique is a high-speed non-destructive image sensing. This technique is essential to obtain high-speed interpolated pictures while maintaining high image quality in video-rate image sensing. The estimated power dissipation of the designed CMOS image sensor is sufficiently low, allowing us to achieve a totally low-power design of one-chip CMOS cameras integrating an image sensor and a video encoder.

This paper presents a response time acceleration technique in a high-gain capacitive-feedback frontend amplifier (FA) for high output impedance sensors. Using an auxiliary amplifier as a unity-gain buffer, a sample-and-hold capacitor which is used for band-limiting and sampling the FA output is driven at the beginning of the transient response to make the response faster and then it is re-charged directly by the FA output. A condition and parameters for the response time acceleration using this technique while maintaining the noise level unaffected are discussed. Theoretical analysis and simulation results show that the response time can be less than half of the case without the acceleration technique for the specified settling error of less than 0.5%.

This letter describes a high-speed wide dynamic range optical pulse receiver for multichannel biotelemetry system. A non-linear feedback impedance approach in transimpedance type receiver has been proposed for achieving wide dynamic range characteristics. A prototype receiver integrated circuit (IC) has been designed and implemented by bipolar IC process.

This paper presents a VLSI-oriented arithmetic design method using a radix-2 redundant number representation with digit set {0, 1, 2} and multiple-valued current-mode (MVCM) circuit technology. We propose a carry-propagation-free (CPF) parallel addition method with redundant digit set {0, 1, 2} which is suitable for the design with MVCM circuits. Several types of CPF parallel adders are compared and the proposed CPF parallel adder with MVCM circuits offers the best total performance with respect to speed, complexity, and power dissipation. The designed basic arithmetic circuits has sufficient noise immunity to the supply voltage fluctuation which is important for stable operations of the VLSI circuits. The CPF parallel adder is effectively used as the reduction scheme of partial products in a high-speed compact multiplier. For example, the designed 3232 bit multiplier reduces the number of active elements to two-third and the number of interconnections to one-fifth of the corresponding binary Wallace tree multiplier, where the speed is almost the same. The structure is simple and regular. The static power dissipation of the designed 32-bit multiplier is estimated to be the mean value of 212 mW and the worst case of 708 mW. The total power including dynamic power dissipation would not be so large compared with that of the 32-bit binary CMOS multiplier reported under 10 MHz operation.

This paper presents a discrete Fourier analyzer using analog VLSI technology. An analog current-mode technique is employed for implementing it by a regular array structure based on the straight-forward discrete Fourier transform (DFT) algorithm. The basic components are 1-dimensional (1-D) analog current-mode multiplier array for fixed coefficient multiplication, two-dimensional (2-D) analog switch array and wired summations. The proposed scheme can process speedily N-point DFT in a time proportional to N. Possibility of the realization of the analog DFT VLSI based on 1 µm technology is discussed from the viewpoints of precision, speed, area, and power dissipation. In the case of 1024-point DFT, the standard deviation of the total error is estimated to be about 2%, the latency, or processing time is about 110 µs, and the signal sample rate based on a pipeline manner is about 4.7 MHz. A prototype MOS integrated circuit of the 16-point multiplier array has been implemented and a typical operation using the multiplier array has been confirmed.

This paper presents a digitally error-corrected pipeline analog-to-digital converter (ADC) using linearization of incomplete settling errors. A pre-charging technique is used for residue amplifiers in order to reduce the incomplete settling error itself and linearize the input signal dependency of the incomplete settling error. A technique with charge redistribution of divided capacitors is proposed for pre-charging capacitors without any additional reference sources. This linearized settling error is corrected by a first-order error approximation in digital domain with feasible complexity and cost. Simulation results show that the ADC achieves SNDR of 70 dB, SFDR of 79 dB at nyquist input frequency in a 65 nm CMOS process under 1.2 V power supply voltage for 1.2 Vp-p input signal swing. The estimated power consumption of the 12b 200 MS/s pipeline ADC using the proposed digital error correction of incomplete settling errors is 7.6 mW with a small FOM of 22 fJ/conv-step.

This paper presents an analog 2-dimensional discrete cosine transform (2-D DCT) processor for focal-plane image compression. The on-chip analog 2-D DCT processor can process directly the analog signal of the CMOS image sensor. The analog-to-digital conversion (ADC) is preformed after the 2-D DCT, and this leads to efficient AD conversion of video signals. Most of the 2-D DCT coefficients can be digitized by a relatively low-resolution ADC or a zero detector. The quantization process after the 2-D DCT can be realized by the ADC at the same time. The 88-point analog 2-D DCT processor is designed by switched-capacitor (SC) coefficient multipliers and an SC analog memory based on 0.35µm CMOS technology. The 2-D DCT processor has sufficient precision, high processing speed, low power dissipation, and small silicon area. The resulting smart image sensor chips with data compression and digital transmission functions are useful for the high-speed image acquisition devices and portable digital video camera systems.

This paper describes the design of a small-offset 12-bit CMOS charge-redistribution DAC using a weighted-mean flip-around sample-and-hold circuit (S/H). Flip-around S/H topology can realize small-offset characteristics, and it is effective to reduce power dissipation and chip area because independent feedback capacitors are not necessary. In this DAC the small-offset characteristic remains not only in amplification phase but also in sampling phase with the circuit technique. The design of 1.8 V, 50 MS/s fully differential DAC with output swing of 2 Vp-p has very small offset of 100 µV for the reset switch mismatch of 2%. A technique to improve dynamic performance measured by SFDR using damping resistors and switches at the output stage is also presented. The designed 12-bit DAC with 0.25 µm CMOS technology has low-power dissipation of 35 mW at 50 MS/s.

In this paper, we present a low-power and area-efficient design method of embedded high-speed A/D converters for mixed analog-digital system LSI's. As the A/D converter topology, a 1.5 bit/stage interleaved pipeline A/D converter is employed, because the basic topology covers a wide range of specifications on the conversion frequency and the resolution. The design method determines the minimum DC supply current, the minimum device sizes and the minimum number of channels to meet the precision given by the specification. This paper also points out that the interleaved pipeline structure is very effective for low-power design of high-speed A/D converters whose sampling frequency is over 100 MHz.

This paper reviews and discusses devices, circuits, and signal processing techniques for CMOS imaging SoC's based on column-parallel processing architecture. The pinned photodiode technology improves the noise characteristics at the device level to be comparable to CCD image sensors and as a result, low-noise design in CMOS image sensors has been shifted to the reduction of noise at the circuit level. Techniques for reducing the circuit noise are discussed. The performance of the imaging SoC's greatly depends on that of the analog-to-digital converter (ADC) used at the column. Three possible architectures of the column-parallel ADC are reviewed and their advantage and disadvantage are discussed. Finally, a few applications of the device and circuit techniques and the column-parallel processing architecture are described.

The RC mismatch among S/H stages for time-interleaved ADCs causes a phase error and a gain error and the phase error is dominant. The paper points out that clock skew and the phase error caused by the RC mismatch have similar effects on the sampling error and then can be compensated with the clock skew compensation. Simulation results agree well with the theoretical analysis. With the phase error compensation of RC mismatch, the SNDR in 14b ADC can be improved by more than 15 dB in the case that the bandwidth of S/H circuits is 3 times the sampling frequency. This paper also proposes a method of clock skew and RC mismatch compensation in time-interleaved sample-and-hold (S/H) circuits by sampling clock phase adjusting.

This paper presents a new scheme of a low-power area-efficient pipelined A/D converter using a single-ended amplifier. The proposed multiply-by-two single-ended amplifier using switched capacitor circuits has smaller DC bias current compared to the conventional fully-differential scheme, and has a small capacitor mismatch sensitivity, allowing us to use a smaller capacitance. The simple high-gain dynamic-biased regulated cascode amplifier also has an excellent switching response. These properties lead to the low-power area-efficient design of high-speed A/D converters. The estimated power dissipation of the 10-b pipelined A/D converter is less than 12 mW at 20 MSample/s.

A digital calibration technique, which corrects errors due to capacitor mismatch in pipelined ADC and directly measures the error coefficients using the ADC INL plot, is described. The proposed technique can be applied for various types of pipelined ADC architectures. Test results using an implemented 10-bit pipelined ADC show that the ADC achieves a peak signal-to-noise-and-distortion ratio of 56.5 dB, a peak integral non-linearity of 0.3 LSB, and a peak differential non-linearity of 0.3 LSB using the digital calibration.