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Nobumitsu HIROSE Takayuki OKADA Shigeru YOSHIMORI Mitsuo KAWAMURA
We successfully fabricated a very narrow gap in niobium film using electron beam lithography and RIE. The width of the gap was about 40 nm. We applied this process to the fabrication of Nb-PbIn-Nb planar Josephson junctions, and one of them showed the Dayem effect.