A simple phase compensation technique with improved power supply rejection ratio (PSRR) for CMOS opamps is proposed. This technique is based on feeding back a current proportional to a derivative of the voltage difference between an output and an input, and does not require a common-gate circuit or a noise-free bias for the circuit. The proposed technique requires only two additional transistors, which are connected to the differential pair of transistors in a cascade manner, and the compensation capacitor is connected to the source node of the additional transistor. Experimental results show an improvement of more than 20 dB in the PSRR at high frequencies, comparing the technique with a Miller compensation. This technique also improves the unity gain frequency and the phase margin from 0.9 MHz and 17 to 1.8 MHz and 44 for 200 pF load capacitance, respectively.

This paper discusses a CMOS differential-difference amplifier circuit suitable for low voltage operation. A new multiple weighted input transconductor circuit structure is suggested to be use in DDA implementation. The proposed DDA can be employed in several analog/digital systems to improve their parameters. Selected examples of the proposed transconductor/DDA applications are also discussed.

The system architectures, which allow a high performance fully balanced (FB) system based on ordinary/modified single-ended opamps to be implemented, are investigated and the basic and general requirements are formulated. Two new methods of an FB analog system design, which contribute towards achieving both a high performance IC system implementation and a great reduction of the design time are presented. It is shown that a single-ended system based on any type of opamp (rail-to-rail, constant gm, etc. ), realized in any technology (CMOS, bipolar, BiCMOS, GaAs), can be easily and effectively converted to its FB counterpart in a very practical way. Using the proposed rules, any FB system implementation with opamps (data converter, modulator, filter, etc. ) requires only a single-ended system version design and the drawbacks related to a conventional FB system design are avoided. The principles of the design are pointed out and they are verified by experimental results.

Our study investigated the realization of a high-precision MOS current-mode circuit. Simple studies have implied that it is difficult to achieve a high signal-to-noise ratio (S/N) in a current-mode circuit. Since the signal voltage at the internal node is suppressed, the circuit is sensitive to various noise sources. To investigate this, we designed and fabricated a current-mode sample-and-hold circuit with a 3V power supply and a 20MHz clock speed, using a standard CMOS 0.6µm device process. The measured S/N reached 57dB and 59dB in sample mode, and 51dB and 54dB in sample-and-hold mode, with 115µA from a 3V power supply and 220µA from a 5V power supply of input currents and a 10MHz noise bandwidth. The S/N analysis based on an actual circuit was done taking device noise sources and the fold-over phenomena of noise in a sampled system into account. The calculation showed 66.9dB of S/N in sample mode and 59.5dB in sample-and-hold-mode with 115µA of input current. Both the analysis and measurement indicated that 60dB of S/N in sample mode with a 10MHz noise bandwidth is an achievable value for this sample-and-hold circuit. It was clear that the current-mode approach limits the S/N performance because of the voltage suppression method. This point should be further studied and discussed.