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[Keyword] 3D ICs(3hit)

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  • A Region-Based Through-Silicon via Repair Method for Clustered Faults

    Tianming NI  Huaguo LIANG  Mu NIE  Xiumin XU  Aibin YAN  Zhengfeng HUANG  

     
    PAPER-Integrated Electronics

      Vol:
    E100-C No:12
      Page(s):
    1108-1117

    Three-dimensional integrated circuits (3D ICs) that employ through-silicon vias (TSVs) integrating multiple dies vertically have opened up the potential of highly improved circuit designs. However, various types of TSV defects may occur during the assembly process, especially the clustered TSV faults because of the winding level of thinned wafer, the surface roughness and cleanness of silicon dies,inducing TSV yield reduction greatly. To tackle this fault clustering problem, router-based and ring-based TSV redundancy architectures were previously proposed. However, these schemes either require too much area overhead or have limited reparability to tolerant clustered TSV faults. Furthermore, the repairing lengths of these schemes are too long to be ignored, leading to additional delay overhead, which may cause timing violation. In this paper, we propose a region-based TSV redundancy design to achieve relatively high reparability as well as low additional delay overhead. Simulation results show that for a given number of TSVs (8*8) and TSV failure rate (1%), our design achieves 11.27% and 20.79% reduction of delay overhead as compared with router-based design and ring-based scheme, respectively. In addition, the reparability of our proposed scheme is much better than ring-based design by 30.84%, while it is close to that of the router-based scheme. More importantly, the overall TSV yield of our design achieves 99.88%, which is slightly higher than that of both router-based method (99.53%) and ring-based design (99.00%).

  • TherWare: Thermal-Aware Placement and Routing Framework for 3D FPGAs with Location-Based Heat Balance

    Ya-Shih HUANG  Han-Yuan CHANG  Juinn-Dar HUANG  

     
    PAPER-VLSI Design Technology and CAD

      Vol:
    E98-A No:8
      Page(s):
    1796-1805

    The emerging three-dimensional (3D) technology is considered as a promising solution for achieving better performance and easier heterogeneous integration. However, the thermal issue becomes exacerbated primarily due to larger power density and longer heat dissipation paths. The thermal issue would also be critical once FPGAs step into the 3D arena. In this article, we first construct a fine-grained thermal resistive model for 3D FPGAs. We show that merely reducing the total power consumption and/or minimizing the power density in vertical direction is not enough for a thermal-aware 3D FPGA backend (placement and routing) flow. Then, we propose our thermal-aware backend flow named TherWare considering location-based heat balance. In the placement stage, TherWare not only considers power distribution of logic tiles in both lateral and vertical directions but also minimizes the interconnect power. In the routing stage, TherWare concentrates on overall power minimization and evenness of power distribution at the same time. Experimental results show that TherWare can significantly reduce the maximum temperature, the maximum temperature gradient, and the temperature deviation only at the cost of a minor increase in delay and runtime as compared with present arts.

  • Thermal-Aware Incremental Floorplanning for 3D ICs Based on MILP Formulation

    Yuchun MA  Xin LI  Yu WANG  Xianlong HONG  

     
    PAPER-Physical Level Desing

      Vol:
    E92-A No:12
      Page(s):
    2979-2989

    In 3D IC design, thermal issue is a critical challenge. To eliminate hotspots, physical layouts are always adjusted by some incremental changes, such as shifting or duplicating hot blocks. In this paper, we distinguish the thermal-aware incremental changes in three different categories: migrating computation, growing unit and moving hotspot blocks. However, these modifications may degrade the packing area as well as interconnect distribution greatly. In this paper, mixed integer linear programming (MILP) models are devised according to these different incremental changes so that multiple objectives can be optimized simultaneously. Furthermore, to avoid random incremental modification, which may be inefficient and need long runtime to converge, here potential gain is modeled for each candidate incremental change. Based on the potential gain, a novel thermal optimization flow to intelligently choose the best incremental operation is presented. Experimental results show that migrating computation, growing unit and moving hotspot can reduce max on-chip temperature by 7%, 13% and 15% respectively on MCNC/GSRC benchmarks. Still, experimental results also show that the thermal optimization flow can reduce max on-chip temperature by 14% to the initial packings generated by an existing 3D floorplanning tool CBA, and achieve better area and total wirelength improvement than individual operations do. The results with the initial packings from CBA_T (Thermal-aware CBA floorplanner) show that 13.5% temperature reduction can be obtained by our incremental optimization flow.

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