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[Keyword] linearity error(2hit)

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  • An On-The-Fly Jitter Suppression Technique for Plain-CMOS-Logic-Based Timing Verniers: Dynamic Power Compensation with the Extensions of Digitally Variable Delay Lines

    Nobutaro SHIBATA  Mitsuo NAKAMURA  

     
    PAPER-VLSI Design Technology and CAD

      Vol:
    E101-A No:8
      Page(s):
    1185-1196

    Timing vernier (i.e., digital-to-time converter) is a key component of the pin-electronics circuit board installed in automated digital-VLSI test equipment, and it is used to create fine delays of less than one-cycle time of a clock signal. This paper presents a new on-the-fly (timing-) jitter suppression technique which makes it possible to use low-power plain-CMOS-logic-based timing verniers. Using a power-compensation line installed at the poststage of the digitally variable delay line, we make every pulse (used as a timing signal) consume a fixed amount of electric energy independent of the required delay amount. Since the power load of intrapowerlines is kept constantly, the jitter increase in the situation of changing the required delay amount on the fly is suppressed. On the basis of the concept, a 10-ns span, 125-MHz timing-vernier macro was designed and fabricated with a CMOS process for logic VLSIs. Every macro installed in a real-time timing-signal generator VLSI achieved the required timing resolution of 31.25ps with a linearity error within 15ps. The on-the-fly jitter was successfully suppressed to a random jitter level (<26ps p-p).

  • Static Linearity Error Analysis of Subranging A/D Converters

    Takashi OKUDA  Toshio KUMAMOTO  Masao ITO  Takahiro MIKI  Keisuke OKADA  Tadashi SUMI  

     
    PAPER

      Vol:
    E79-A No:2
      Page(s):
    210-216

    An 8-to 10-bit CMOS A/D converter with a conversion rate of more than 16 megasample/second is required in consumer video systems. Subranging architecture is widely used to realize such A/D converters. This architecture, however, exhibits an reference voltage error caused by resistor ladder loadings. The error has been discussed with respect to a flash A/D converter by Dingwall. However, it can not be applied for a subranging A/D converter as it is. The analysis of this error is very important in realizing the desired accuracy of a subranging A/D converter. This paper describes a static analysis to improve the linearity, and reports the results of this analysis for two typical types, one with invividual comparator arrays for coarse and fine A/D conversions, and the other with the same comparator array for both conversions. This analysis makes it clear that a subranging A/D converter has unique saw-tooth characteristic in fine linearity errors. Furthermore, this analysis clarifies what conditions are necessary to achieve the desired accuracy. It is necessary, for example, that the product of the total input capacitance of the comparators C, the conversion rate fs and the total ladder resistance R is less than 0.03 in A/D converters with individual comparator arrays and 0.016 in A/D converters with the same comparator array in order to achieve 10-bit accuracy.

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