Dynamically-programmable gate arrays (DPGAs) promise lower-cost implementations than conventional field-programmable gate arrays (FPGAs) since they efficiently reuse limited hardware resources in time. One of the typical DPGA architectures is a multi-context FPGA (MC-FPGA) that requires multiple memory bits per configuration bit to realize fast context switching. However, this additional memory bits cause significant overhead in area and power consumption. This paper presents novel architecture of a switch element to overcome the required capacity of configuration memory. Our main idea is to exploit redundancy between different contexts by using a fine-grained switch element. The proposed MC-FPGA is designed in a 0.18 µm CMOS technology. Its maximum clock frequency and the context switching frequency are measured to be 310 MHz and 272 MHz, respectively. Moreover, novel CAD process that exploits the redundancy in configuration data, is proposed to support the MC-FPGA architecture.

Multi-context FPGAs allow very quick reconfiguration by storing multiple configuration data at the same time. While testing for FPGAs with single-context memories has already been studied by many researchers, testing for multi-context FPGAs has not been proposed yet. This paper presents an architecture of testable multi-context FPGAs. In the proposed multi-context FPGA, configuration data stored in a context can be copied into another context. This paper also shows testing of the proposed multi-context FPGA. The proposed testing uses the testing for the traditional FPGAs with single-context. The testing is capable of detecting single stuck-at faults and single open faults which affect normal operations. The number of test configurations for the proposed testing is at most two more than that for the testing of FPGAs with single-context memories. The area overhead of the proposed architecture is 7% and 4% of the area of a multi-context FPGA without the proposed architecture when the number of contexts in a configuration memory is 8 and 16, respectively.