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  • Subthreshold SRAM with Write Assist Technique Using On-Chip Threshold Voltage Monitoring Circuit

    Kei MATSUMOTO  Tetsuya HIROSE  Yuji OSAKI  Nobutaka KUROKI  Masahiro NUMA  

     
    PAPER

      Vol:
    E94-C No:6
      Page(s):
    1042-1048

    We propose a subthreshold Static Random Access Memory (SRAM) circuit architecture with improved write ability. Even though the circuits can achieve ultra-low power dissipation in subthreshold digital circuits, the performance is significantly degraded with threshold voltage variations due to the fabrication process and temperature. Because the write operation of SRAM is prone to failure due to the unbalance of threshold voltages between the nMOSFET and pMOSFET, stable operation cannot be ensured. To achieve robust write operation of SRAM, we developed a compensation technique by using an adaptive voltage scaling technique that uses an on-chip threshold voltage monitoring circuit. The monitoring circuit detects the threshold voltage of a MOSFET with the on-chip circuit configuration. By using the monitoring voltage as a supply voltage for SRAM cells, write operation can be compensated without degrading cell stability. Monte Carlo simulations demonstrated that the proposed SRAM architecture exhibits a smaller write operation failure rate and write time variation than a conventional 6T SRAM.

  • Wide Range CMOS Voltage Detector with Low Current Consumption and Low Temperature Variation

    Kawori TAKAKUBO  Hajime TAKAKUBO  

     
    PAPER

      Vol:
    E92-A No:2
      Page(s):
    443-450

    A wide range CMOS voltage detector with low current consumption consisting of CMOS inverters operating in both weak inversion and saturation region is proposed. A terminal of power supply for CMOS inverter can be expanded to a signal input terminal. A voltage-detection point and hysteresis characteristics of the proposed circuit can be designed by geometrical factor in MOSFET and an external bias voltage. The core circuit elements are fabricated in standard 0.18 µm CMOS process and measured to confirm the operation. The detectable voltage is from 0.3 V to 1.8 V. The current consumption of voltage detection, standby current, is changed from 65 pA for Vin = 0.3 V to 5.5 µA for Vin = 1.8 V. The thermal characteristics from 250 K to 400 K are also considered. The measured temperature coefficient of the proposed voltage-detector core operating in weak inversion region is 4 ppm/K and that in saturation region is 10 ppm/K. The proposed voltage detector can be implemented with tiny chip area and is expected to an on-chip voltage detector of power supply for mobile application systems.

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