We have fabricated a multilayer structure for single flux quantum (SFQ) circuit application using a high-temperature superconductor (HTS). La0.2-Y0.9Ba1.9Cu3Ox (La-YBCO) base electrode layers were prepared by a dc or rf magnetron sputtering method. The reproducibility of film quality for dc-sputtered La-YBCO films was better than that for rf-sputtered films, and the dc sputtered films exhibited the average surface roughness Ra less than 1.0 nm and a Tc zero value of 88 K. By using the dc-sputtered La-YBCO films, a multilayer structure of SrSnO3/La-YBCO/SrSnO3/La-YBCO on MgO substrate with Ra below 2.0 nm was obtained. Interface-modified ramp-edge junctions with La0.2-Yb0.9Ba1.9Cu3Ox (La-YbBCO) counter electrodes have been fabricated by using this multilayer structure with dc-sputtered films. The fabricated junctions exhibited RSJ-type I-V characteristics with IcRn products of about 3 mV at 4.2 K. We also obtained a 1-σ Ic spread of 8% for a 1000-junction series-array. The sheet inductance values at 4.2 K for the base and counter electrodes on La-YBCO ground planes were 0.8 pH and 0.7 pH per square, respectively. Operation of several types of elementary SFQ circuits has been successfully demonstrated by using this multilayer structure.
Hironori WAKANA
Seiji ADACHI
Ai KAMITANI
Kouhei NAKAYAMA
Yoshihiro ISHIMARU
Yoshinobu TARUTANI
Keiichi TANABE
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Hironori WAKANA, Seiji ADACHI, Ai KAMITANI, Kouhei NAKAYAMA, Yoshihiro ISHIMARU, Yoshinobu TARUTANI, Keiichi TANABE, "Development of Thin Film Multilayer Structures with Smooth Surfaces for HTS SFQ Circuits" in IEICE TRANSACTIONS on Electronics,
vol. E88-C, no. 2, pp. 208-215, February 2005, doi: 10.1093/ietele/e88-c.2.208.
Abstract: We have fabricated a multilayer structure for single flux quantum (SFQ) circuit application using a high-temperature superconductor (HTS). La0.2-Y0.9Ba1.9Cu3Ox (La-YBCO) base electrode layers were prepared by a dc or rf magnetron sputtering method. The reproducibility of film quality for dc-sputtered La-YBCO films was better than that for rf-sputtered films, and the dc sputtered films exhibited the average surface roughness Ra less than 1.0 nm and a Tc zero value of 88 K. By using the dc-sputtered La-YBCO films, a multilayer structure of SrSnO3/La-YBCO/SrSnO3/La-YBCO on MgO substrate with Ra below 2.0 nm was obtained. Interface-modified ramp-edge junctions with La0.2-Yb0.9Ba1.9Cu3Ox (La-YbBCO) counter electrodes have been fabricated by using this multilayer structure with dc-sputtered films. The fabricated junctions exhibited RSJ-type I-V characteristics with IcRn products of about 3 mV at 4.2 K. We also obtained a 1-σ Ic spread of 8% for a 1000-junction series-array. The sheet inductance values at 4.2 K for the base and counter electrodes on La-YBCO ground planes were 0.8 pH and 0.7 pH per square, respectively. Operation of several types of elementary SFQ circuits has been successfully demonstrated by using this multilayer structure.
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e88-c.2.208/_p
Copy
@ARTICLE{e88-c_2_208,
author={Hironori WAKANA, Seiji ADACHI, Ai KAMITANI, Kouhei NAKAYAMA, Yoshihiro ISHIMARU, Yoshinobu TARUTANI, Keiichi TANABE, },
journal={IEICE TRANSACTIONS on Electronics},
title={Development of Thin Film Multilayer Structures with Smooth Surfaces for HTS SFQ Circuits},
year={2005},
volume={E88-C},
number={2},
pages={208-215},
abstract={We have fabricated a multilayer structure for single flux quantum (SFQ) circuit application using a high-temperature superconductor (HTS). La0.2-Y0.9Ba1.9Cu3Ox (La-YBCO) base electrode layers were prepared by a dc or rf magnetron sputtering method. The reproducibility of film quality for dc-sputtered La-YBCO films was better than that for rf-sputtered films, and the dc sputtered films exhibited the average surface roughness Ra less than 1.0 nm and a Tc zero value of 88 K. By using the dc-sputtered La-YBCO films, a multilayer structure of SrSnO3/La-YBCO/SrSnO3/La-YBCO on MgO substrate with Ra below 2.0 nm was obtained. Interface-modified ramp-edge junctions with La0.2-Yb0.9Ba1.9Cu3Ox (La-YbBCO) counter electrodes have been fabricated by using this multilayer structure with dc-sputtered films. The fabricated junctions exhibited RSJ-type I-V characteristics with IcRn products of about 3 mV at 4.2 K. We also obtained a 1-σ Ic spread of 8% for a 1000-junction series-array. The sheet inductance values at 4.2 K for the base and counter electrodes on La-YBCO ground planes were 0.8 pH and 0.7 pH per square, respectively. Operation of several types of elementary SFQ circuits has been successfully demonstrated by using this multilayer structure.},
keywords={},
doi={10.1093/ietele/e88-c.2.208},
ISSN={},
month={February},}
Copy
TY - JOUR
TI - Development of Thin Film Multilayer Structures with Smooth Surfaces for HTS SFQ Circuits
T2 - IEICE TRANSACTIONS on Electronics
SP - 208
EP - 215
AU - Hironori WAKANA
AU - Seiji ADACHI
AU - Ai KAMITANI
AU - Kouhei NAKAYAMA
AU - Yoshihiro ISHIMARU
AU - Yoshinobu TARUTANI
AU - Keiichi TANABE
PY - 2005
DO - 10.1093/ietele/e88-c.2.208
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E88-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 2005
AB - We have fabricated a multilayer structure for single flux quantum (SFQ) circuit application using a high-temperature superconductor (HTS). La0.2-Y0.9Ba1.9Cu3Ox (La-YBCO) base electrode layers were prepared by a dc or rf magnetron sputtering method. The reproducibility of film quality for dc-sputtered La-YBCO films was better than that for rf-sputtered films, and the dc sputtered films exhibited the average surface roughness Ra less than 1.0 nm and a Tc zero value of 88 K. By using the dc-sputtered La-YBCO films, a multilayer structure of SrSnO3/La-YBCO/SrSnO3/La-YBCO on MgO substrate with Ra below 2.0 nm was obtained. Interface-modified ramp-edge junctions with La0.2-Yb0.9Ba1.9Cu3Ox (La-YbBCO) counter electrodes have been fabricated by using this multilayer structure with dc-sputtered films. The fabricated junctions exhibited RSJ-type I-V characteristics with IcRn products of about 3 mV at 4.2 K. We also obtained a 1-σ Ic spread of 8% for a 1000-junction series-array. The sheet inductance values at 4.2 K for the base and counter electrodes on La-YBCO ground planes were 0.8 pH and 0.7 pH per square, respectively. Operation of several types of elementary SFQ circuits has been successfully demonstrated by using this multilayer structure.
ER -