A New Analog-to-Digital Converter BIST Considering a Transient Zone

Incheol KIM; Kicheol KIM; Youbean KIM; HyeonUk SON; Sungho KANG

doi:10.1093/ietele/e90-c.11.2161

A New Analog-to-Digital Converter BIST Considering a Transient Zone

Incheol KIM, Kicheol KIM, Youbean KIM, HyeonUk SON, Sungho KANG

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Summary :

A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.

Publication: IEICE TRANSACTIONS on Electronics Vol.E90-C No.11 pp.2161-2163

Publication Date: 2007/11/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1093/ietele/e90-c.11.2161

Type of Manuscript: LETTER

Category: Integrated Electronics

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Incheol KIM, Kicheol KIM, Youbean KIM, HyeonUk SON, Sungho KANG, "A New Analog-to-Digital Converter BIST Considering a Transient Zone" in IEICE TRANSACTIONS on Electronics, vol. E90-C, no. 11, pp. 2161-2163, November 2007, doi: 10.1093/ietele/e90-c.11.2161.
Abstract: A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e90-c.11.2161/_p

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@ARTICLE{e90-c_11_2161,
author={Incheol KIM, Kicheol KIM, Youbean KIM, HyeonUk SON, Sungho KANG, },
journal={IEICE TRANSACTIONS on Electronics},
title={A New Analog-to-Digital Converter BIST Considering a Transient Zone},
year={2007},
volume={E90-C},
number={11},
pages={2161-2163},
abstract={A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.},
keywords={},
doi={10.1093/ietele/e90-c.11.2161},
ISSN={1745-1353},
month={November},}

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TY - JOUR
TI - A New Analog-to-Digital Converter BIST Considering a Transient Zone
T2 - IEICE TRANSACTIONS on Electronics
SP - 2161
EP - 2163
AU - Incheol KIM
AU - Kicheol KIM
AU - Youbean KIM
AU - HyeonUk SON
AU - Sungho KANG
PY - 2007
DO - 10.1093/ietele/e90-c.11.2161
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E90-C
IS - 11
JA - IEICE TRANSACTIONS on Electronics
Y1 - November 2007
AB - A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.
ER -