Single flux quantum (SFQ) circuit elements have been designed and fabricated using the YBa2Cu3O7-δ ramp-edge junction technology. Logic operations of SFQ circuit elements, such as a toggle flip-flop (T-FF), a set-reset flip-flop (RS-FF), and a 96-junction Josephson transmission line (JTL), were successfully demonstrated, and dc supply current margins were confirmed up to temperatures higher than 30 K. The circuit layout was improved in order to suppress the critical current (Ic) spread that appears during the junction fabrication procedure. By employing the new circuit layout rule, correct operations at temperatures from 27 K to 34 K with dc supply current margins wider than
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Koji TSUBONE, Hironori WAKANA, Yoshinobu TARUTANI, Seiji ADACHI, Yoshihiro ISHIMARU, Keiichi TANABE, "Design and Operation of HTS SFQ Circuit Elements" in IEICE TRANSACTIONS on Electronics,
vol. E90-C, no. 3, pp. 570-578, March 2007, doi: 10.1093/ietele/e90-c.3.570.
Abstract: Single flux quantum (SFQ) circuit elements have been designed and fabricated using the YBa2Cu3O7-δ ramp-edge junction technology. Logic operations of SFQ circuit elements, such as a toggle flip-flop (T-FF), a set-reset flip-flop (RS-FF), and a 96-junction Josephson transmission line (JTL), were successfully demonstrated, and dc supply current margins were confirmed up to temperatures higher than 30 K. The circuit layout was improved in order to suppress the critical current (Ic) spread that appears during the junction fabrication procedure. By employing the new circuit layout rule, correct operations at temperatures from 27 K to 34 K with dc supply current margins wider than
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e90-c.3.570/_p
Copy
@ARTICLE{e90-c_3_570,
author={Koji TSUBONE, Hironori WAKANA, Yoshinobu TARUTANI, Seiji ADACHI, Yoshihiro ISHIMARU, Keiichi TANABE, },
journal={IEICE TRANSACTIONS on Electronics},
title={Design and Operation of HTS SFQ Circuit Elements},
year={2007},
volume={E90-C},
number={3},
pages={570-578},
abstract={Single flux quantum (SFQ) circuit elements have been designed and fabricated using the YBa2Cu3O7-δ ramp-edge junction technology. Logic operations of SFQ circuit elements, such as a toggle flip-flop (T-FF), a set-reset flip-flop (RS-FF), and a 96-junction Josephson transmission line (JTL), were successfully demonstrated, and dc supply current margins were confirmed up to temperatures higher than 30 K. The circuit layout was improved in order to suppress the critical current (Ic) spread that appears during the junction fabrication procedure. By employing the new circuit layout rule, correct operations at temperatures from 27 K to 34 K with dc supply current margins wider than
keywords={},
doi={10.1093/ietele/e90-c.3.570},
ISSN={1745-1353},
month={March},}
Copy
TY - JOUR
TI - Design and Operation of HTS SFQ Circuit Elements
T2 - IEICE TRANSACTIONS on Electronics
SP - 570
EP - 578
AU - Koji TSUBONE
AU - Hironori WAKANA
AU - Yoshinobu TARUTANI
AU - Seiji ADACHI
AU - Yoshihiro ISHIMARU
AU - Keiichi TANABE
PY - 2007
DO - 10.1093/ietele/e90-c.3.570
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E90-C
IS - 3
JA - IEICE TRANSACTIONS on Electronics
Y1 - March 2007
AB - Single flux quantum (SFQ) circuit elements have been designed and fabricated using the YBa2Cu3O7-δ ramp-edge junction technology. Logic operations of SFQ circuit elements, such as a toggle flip-flop (T-FF), a set-reset flip-flop (RS-FF), and a 96-junction Josephson transmission line (JTL), were successfully demonstrated, and dc supply current margins were confirmed up to temperatures higher than 30 K. The circuit layout was improved in order to suppress the critical current (Ic) spread that appears during the junction fabrication procedure. By employing the new circuit layout rule, correct operations at temperatures from 27 K to 34 K with dc supply current margins wider than
ER -