Various kinds of optical near-field apertures have been proposed for higher throughput and smaller spot size. However, few studies have mentioned the readout characteristics of the recorded marks on an optical disk illuminated by a near field optical light. In this paper, we have investigated the scattering light by a two-dimensional recorded mark on a phase change disk with Finite-Difference Time-Domain (FDTD) simulations. Instead of using Recursive Convolution (RC) and Piecewise Linear Recursive Convolution (PLRC) scheme, we integrated the motion equation of free electron into conventional FDTD method to solve the electromagnetic field in the metallic materials. The validity of the proposed method is illustrated by comparing its results with those from the analytic exact solution. We analyzed the distributions of optical near-field around a two-dimensional metallic nano-aperture, and then calculated the far-field scattering pattern from a two-dimensional recorded mark on a phase change disk while it was illuminated by an optical near-field though a nanoaperture. The sum signal by a condenser lens was calculated from far-field pattern, and its relationships with the width of recorded mark and the thickness of each layer in the phase change disk were illustrated. The cross-talk between the recorded marks was also discussed.
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Shinya KAGAWA, Yiwei HE, Toshitaka KOJIMA, "Two-Dimensional FDTD Analysis of the Readout Characteristics of an Optical Near Field Disk" in IEICE TRANSACTIONS on Electronics,
vol. E91-C, no. 1, pp. 48-55, January 2008, doi: 10.1093/ietele/e91-c.1.48.
Abstract: Various kinds of optical near-field apertures have been proposed for higher throughput and smaller spot size. However, few studies have mentioned the readout characteristics of the recorded marks on an optical disk illuminated by a near field optical light. In this paper, we have investigated the scattering light by a two-dimensional recorded mark on a phase change disk with Finite-Difference Time-Domain (FDTD) simulations. Instead of using Recursive Convolution (RC) and Piecewise Linear Recursive Convolution (PLRC) scheme, we integrated the motion equation of free electron into conventional FDTD method to solve the electromagnetic field in the metallic materials. The validity of the proposed method is illustrated by comparing its results with those from the analytic exact solution. We analyzed the distributions of optical near-field around a two-dimensional metallic nano-aperture, and then calculated the far-field scattering pattern from a two-dimensional recorded mark on a phase change disk while it was illuminated by an optical near-field though a nanoaperture. The sum signal by a condenser lens was calculated from far-field pattern, and its relationships with the width of recorded mark and the thickness of each layer in the phase change disk were illustrated. The cross-talk between the recorded marks was also discussed.
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.1.48/_p
Copy
@ARTICLE{e91-c_1_48,
author={Shinya KAGAWA, Yiwei HE, Toshitaka KOJIMA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Two-Dimensional FDTD Analysis of the Readout Characteristics of an Optical Near Field Disk},
year={2008},
volume={E91-C},
number={1},
pages={48-55},
abstract={Various kinds of optical near-field apertures have been proposed for higher throughput and smaller spot size. However, few studies have mentioned the readout characteristics of the recorded marks on an optical disk illuminated by a near field optical light. In this paper, we have investigated the scattering light by a two-dimensional recorded mark on a phase change disk with Finite-Difference Time-Domain (FDTD) simulations. Instead of using Recursive Convolution (RC) and Piecewise Linear Recursive Convolution (PLRC) scheme, we integrated the motion equation of free electron into conventional FDTD method to solve the electromagnetic field in the metallic materials. The validity of the proposed method is illustrated by comparing its results with those from the analytic exact solution. We analyzed the distributions of optical near-field around a two-dimensional metallic nano-aperture, and then calculated the far-field scattering pattern from a two-dimensional recorded mark on a phase change disk while it was illuminated by an optical near-field though a nanoaperture. The sum signal by a condenser lens was calculated from far-field pattern, and its relationships with the width of recorded mark and the thickness of each layer in the phase change disk were illustrated. The cross-talk between the recorded marks was also discussed.},
keywords={},
doi={10.1093/ietele/e91-c.1.48},
ISSN={1745-1353},
month={January},}
Copy
TY - JOUR
TI - Two-Dimensional FDTD Analysis of the Readout Characteristics of an Optical Near Field Disk
T2 - IEICE TRANSACTIONS on Electronics
SP - 48
EP - 55
AU - Shinya KAGAWA
AU - Yiwei HE
AU - Toshitaka KOJIMA
PY - 2008
DO - 10.1093/ietele/e91-c.1.48
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 2008
AB - Various kinds of optical near-field apertures have been proposed for higher throughput and smaller spot size. However, few studies have mentioned the readout characteristics of the recorded marks on an optical disk illuminated by a near field optical light. In this paper, we have investigated the scattering light by a two-dimensional recorded mark on a phase change disk with Finite-Difference Time-Domain (FDTD) simulations. Instead of using Recursive Convolution (RC) and Piecewise Linear Recursive Convolution (PLRC) scheme, we integrated the motion equation of free electron into conventional FDTD method to solve the electromagnetic field in the metallic materials. The validity of the proposed method is illustrated by comparing its results with those from the analytic exact solution. We analyzed the distributions of optical near-field around a two-dimensional metallic nano-aperture, and then calculated the far-field scattering pattern from a two-dimensional recorded mark on a phase change disk while it was illuminated by an optical near-field though a nanoaperture. The sum signal by a condenser lens was calculated from far-field pattern, and its relationships with the width of recorded mark and the thickness of each layer in the phase change disk were illustrated. The cross-talk between the recorded marks was also discussed.
ER -