A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters

Kicheol KIM; Youbean KIM; Incheol KIM; Hyeonuk SON; Sungho KANG

doi:10.1093/ietele/e91-c.4.670

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters

Kicheol KIM, Youbean KIM, Incheol KIM, Hyeonuk SON, Sungho KANG

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In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC.

Publication: IEICE TRANSACTIONS on Electronics Vol.E91-C No.4 pp.670-672

Publication Date: 2008/04/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1093/ietele/e91-c.4.670

Type of Manuscript: LETTER

Category: Semiconductor Materials and Devices

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Kicheol KIM, Youbean KIM, Incheol KIM, Hyeonuk SON, Sungho KANG, "A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters" in IEICE TRANSACTIONS on Electronics, vol. E91-C, no. 4, pp. 670-672, April 2008, doi: 10.1093/ietele/e91-c.4.670.
Abstract: In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC.
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e91-c.4.670/_p

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@ARTICLE{e91-c_4_670,
author={Kicheol KIM, Youbean KIM, Incheol KIM, Hyeonuk SON, Sungho KANG, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters},
year={2008},
volume={E91-C},
number={4},
pages={670-672},
abstract={In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC.},
keywords={},
doi={10.1093/ietele/e91-c.4.670},
ISSN={1745-1353},
month={April},}

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TY - JOUR
TI - A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
T2 - IEICE TRANSACTIONS on Electronics
SP - 670
EP - 672
AU - Kicheol KIM
AU - Youbean KIM
AU - Incheol KIM
AU - Hyeonuk SON
AU - Sungho KANG
PY - 2008
DO - 10.1093/ietele/e91-c.4.670
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E91-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 2008
AB - In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC.
ER -