Investigation on the Possible Electric Field Effect and Surface Morphology of a YBCO/CeO<SUB>2</SUB>/Au MIS Diode

Qian WANG; Ienari IGUCHI

Investigation on the Possible Electric Field Effect and Surface Morphology of a YBCO/CeO₂/Au MIS Diode

Qian WANG, Ienari IGUCHI

Full Text Views

0

Share
Cite this

Summary :

A YBCO/CeO₂/Au MIS structure (YBCO:YBa₂Cu₃O_7y) is fabricated on a MgO(100) substrate with the help of the all-in-situ electron-beam and heater coevaperation system. The current-voltage (I-V) characteristics of the deposited YBCO film under various gate voltages are examined. Small modulation of the I-V characteristics by gate voltages can be observed. Meanwhile, the surface morphology is also studied by means of an atomic force microscope (AFM). The relation between the field effect and the surface morphology of a thin YBCO film is discussed.

Publication: IEICE TRANSACTIONS on Electronics Vol.E76-C No.8 pp.1271-1274

Publication Date: 1993/08/25

Publicized

Online ISSN

DOI

Type of Manuscript: Special Section PAPER (Special Issue on High-Temperature Superconducting Electronics)

Category

Cite this

Copy

Qian WANG, Ienari IGUCHI, "Investigation on the Possible Electric Field Effect and Surface Morphology of a YBCO/CeO2/Au MIS Diode" in IEICE TRANSACTIONS on Electronics, vol. E76-C, no. 8, pp. 1271-1274, August 1993, doi: .
Abstract: A YBCO/CeO₂/Au MIS structure (YBCO:YBa₂Cu₃O_7y) is fabricated on a MgO(100) substrate with the help of the all-in-situ electron-beam and heater coevaperation system. The current-voltage (I-V) characteristics of the deposited YBCO film under various gate voltages are examined. Small modulation of the I-V characteristics by gate voltages can be observed. Meanwhile, the surface morphology is also studied by means of an atomic force microscope (AFM). The relation between the field effect and the surface morphology of a thin YBCO film is discussed.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e76-c_8_1271/_p

Copy

@ARTICLE{e76-c_8_1271,
author={Qian WANG, Ienari IGUCHI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Investigation on the Possible Electric Field Effect and Surface Morphology of a YBCO/CeO2/Au MIS Diode},
year={1993},
volume={E76-C},
number={8},
pages={1271-1274},
abstract={A YBCO/CeO₂/Au MIS structure (YBCO:YBa₂Cu₃O_7y) is fabricated on a MgO(100) substrate with the help of the all-in-situ electron-beam and heater coevaperation system. The current-voltage (I-V) characteristics of the deposited YBCO film under various gate voltages are examined. Small modulation of the I-V characteristics by gate voltages can be observed. Meanwhile, the surface morphology is also studied by means of an atomic force microscope (AFM). The relation between the field effect and the surface morphology of a thin YBCO film is discussed.},
keywords={},
doi={},
ISSN={},
month={August},}

Copy

TY - JOUR
TI - Investigation on the Possible Electric Field Effect and Surface Morphology of a YBCO/CeO2/Au MIS Diode
T2 - IEICE TRANSACTIONS on Electronics
SP - 1271
EP - 1274
AU - Qian WANG
AU - Ienari IGUCHI
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E76-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 1993
AB - A YBCO/CeO₂/Au MIS structure (YBCO:YBa₂Cu₃O_7y) is fabricated on a MgO(100) substrate with the help of the all-in-situ electron-beam and heater coevaperation system. The current-voltage (I-V) characteristics of the deposited YBCO film under various gate voltages are examined. Small modulation of the I-V characteristics by gate voltages can be observed. Meanwhile, the surface morphology is also studied by means of an atomic force microscope (AFM). The relation between the field effect and the surface morphology of a thin YBCO film is discussed.
ER -