Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination

Zhihong MA; Seichi OKAMURA

Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination

Zhihong MA, Seichi OKAMURA

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An analysis is carried out about the reflection influence on the microwave attenuation measurement for moisture content determination. A new method taking into account the reflection influence is proposed and it is proved valid by the experiment results. Using this method, the density dependence of the attenuation is measured and the measured data can be fitted well by a straight line passing through the origin. Therefore, the attenuation per unit density and propagation distance is a function which depends only on the moisture content and the function is useful to the determination of the moisture content.

Publication: IEICE TRANSACTIONS on Electronics Vol.E80-C No.10 pp.1324-1329

Publication Date: 1997/10/25

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Category: Microwave and Millimeter Wave Technology

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Zhihong MA, Seichi OKAMURA, "Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination" in IEICE TRANSACTIONS on Electronics, vol. E80-C, no. 10, pp. 1324-1329, October 1997, doi: .
Abstract: An analysis is carried out about the reflection influence on the microwave attenuation measurement for moisture content determination. A new method taking into account the reflection influence is proposed and it is proved valid by the experiment results. Using this method, the density dependence of the attenuation is measured and the measured data can be fitted well by a straight line passing through the origin. Therefore, the attenuation per unit density and propagation distance is a function which depends only on the moisture content and the function is useful to the determination of the moisture content.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e80-c_10_1324/_p

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@ARTICLE{e80-c_10_1324,
author={Zhihong MA, Seichi OKAMURA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination},
year={1997},
volume={E80-C},
number={10},
pages={1324-1329},
abstract={An analysis is carried out about the reflection influence on the microwave attenuation measurement for moisture content determination. A new method taking into account the reflection influence is proposed and it is proved valid by the experiment results. Using this method, the density dependence of the attenuation is measured and the measured data can be fitted well by a straight line passing through the origin. Therefore, the attenuation per unit density and propagation distance is a function which depends only on the moisture content and the function is useful to the determination of the moisture content.},
keywords={},
doi={},
ISSN={},
month={October},}

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TY - JOUR
TI - Analysis and Elimination of the Reflection lnfluence on Microwave Attenuation Measurement for Moisture Determination
T2 - IEICE TRANSACTIONS on Electronics
SP - 1324
EP - 1329
AU - Zhihong MA
AU - Seichi OKAMURA
PY - 1997
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E80-C
IS - 10
JA - IEICE TRANSACTIONS on Electronics
Y1 - October 1997
AB - An analysis is carried out about the reflection influence on the microwave attenuation measurement for moisture content determination. A new method taking into account the reflection influence is proposed and it is proved valid by the experiment results. Using this method, the density dependence of the attenuation is measured and the measured data can be fitted well by a straight line passing through the origin. Therefore, the attenuation per unit density and propagation distance is a function which depends only on the moisture content and the function is useful to the determination of the moisture content.
ER -