DFV-Aware Flip-Flops Using C-Elements

Changnoh YOON; Youngmin CHO; Jinsang KIM

doi:10.1587/transele.E94.C.1229

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Changnoh YOON, Youngmin CHO, Jinsang KIM, "DFV-Aware Flip-Flops Using C-Elements" in IEICE TRANSACTIONS on Electronics, vol. E94-C, no. 7, pp. 1229-1232, July 2011, doi: 10.1587/transele.E94.C.1229.
Abstract: Advanced nanometer circuits are susceptible to errors caused by process, voltage, and temperature (PVT) variations or due to a single event upset (SEU). State-of-the-art design-for-variability (DFV)-aware flip-flops (FFs) suffer from their area and timing overheads. By utilizing C-element modules, two types of FFs are proposed for error detection and error correction.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E94.C.1229/_p

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@ARTICLE{e94-c_7_1229,
author={Changnoh YOON, Youngmin CHO, Jinsang KIM, },
journal={IEICE TRANSACTIONS on Electronics},
title={DFV-Aware Flip-Flops Using C-Elements},
year={2011},
volume={E94-C},
number={7},
pages={1229-1232},
abstract={Advanced nanometer circuits are susceptible to errors caused by process, voltage, and temperature (PVT) variations or due to a single event upset (SEU). State-of-the-art design-for-variability (DFV)-aware flip-flops (FFs) suffer from their area and timing overheads. By utilizing C-element modules, two types of FFs are proposed for error detection and error correction.},
keywords={},
doi={10.1587/transele.E94.C.1229},
ISSN={1745-1353},
month={July},}

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TY - JOUR
TI - DFV-Aware Flip-Flops Using C-Elements
T2 - IEICE TRANSACTIONS on Electronics
SP - 1229
EP - 1232
AU - Changnoh YOON
AU - Youngmin CHO
AU - Jinsang KIM
PY - 2011
DO - 10.1587/transele.E94.C.1229
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E94-C
IS - 7
JA - IEICE TRANSACTIONS on Electronics
Y1 - July 2011
AB - Advanced nanometer circuits are susceptible to errors caused by process, voltage, and temperature (PVT) variations or due to a single event upset (SEU). State-of-the-art design-for-variability (DFV)-aware flip-flops (FFs) suffer from their area and timing overheads. By utilizing C-element modules, two types of FFs are proposed for error detection and error correction.
ER -