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The most commonly used scattering parameters (S parameters) are normalized to a real reference resistance, typically 50Ω. In some cases, the use of S parameters normalized to some complex reference impedance is essential or convenient. But there are different definitions of complex-referenced S parameters that are incompatible with each other and serve different purposes. To make matters worse, different simulators implement different ones and which ones are implemented is rarely properly documented. What are possible scenarios in which using the right one matters? This tutorial-style paper is meant as an informal and not overly technical exposition of some such confusing aspects of S parameters, for those who have a basic familiarity with the ordinary, real-referenced S parameters.
Shuhei AMAKAWA
Hiroshima University
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Shuhei AMAKAWA, "Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —" in IEICE TRANSACTIONS on Electronics,
vol. E99-C, no. 10, pp. 1100-1112, October 2016, doi: 10.1587/transele.E99.C.1100.
Abstract: The most commonly used scattering parameters (S parameters) are normalized to a real reference resistance, typically 50Ω. In some cases, the use of S parameters normalized to some complex reference impedance is essential or convenient. But there are different definitions of complex-referenced S parameters that are incompatible with each other and serve different purposes. To make matters worse, different simulators implement different ones and which ones are implemented is rarely properly documented. What are possible scenarios in which using the right one matters? This tutorial-style paper is meant as an informal and not overly technical exposition of some such confusing aspects of S parameters, for those who have a basic familiarity with the ordinary, real-referenced S parameters.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E99.C.1100/_p
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@ARTICLE{e99-c_10_1100,
author={Shuhei AMAKAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —},
year={2016},
volume={E99-C},
number={10},
pages={1100-1112},
abstract={The most commonly used scattering parameters (S parameters) are normalized to a real reference resistance, typically 50Ω. In some cases, the use of S parameters normalized to some complex reference impedance is essential or convenient. But there are different definitions of complex-referenced S parameters that are incompatible with each other and serve different purposes. To make matters worse, different simulators implement different ones and which ones are implemented is rarely properly documented. What are possible scenarios in which using the right one matters? This tutorial-style paper is meant as an informal and not overly technical exposition of some such confusing aspects of S parameters, for those who have a basic familiarity with the ordinary, real-referenced S parameters.},
keywords={},
doi={10.1587/transele.E99.C.1100},
ISSN={1745-1353},
month={October},}
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TY - JOUR
TI - Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —
T2 - IEICE TRANSACTIONS on Electronics
SP - 1100
EP - 1112
AU - Shuhei AMAKAWA
PY - 2016
DO - 10.1587/transele.E99.C.1100
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E99-C
IS - 10
JA - IEICE TRANSACTIONS on Electronics
Y1 - October 2016
AB - The most commonly used scattering parameters (S parameters) are normalized to a real reference resistance, typically 50Ω. In some cases, the use of S parameters normalized to some complex reference impedance is essential or convenient. But there are different definitions of complex-referenced S parameters that are incompatible with each other and serve different purposes. To make matters worse, different simulators implement different ones and which ones are implemented is rarely properly documented. What are possible scenarios in which using the right one matters? This tutorial-style paper is meant as an informal and not overly technical exposition of some such confusing aspects of S parameters, for those who have a basic familiarity with the ordinary, real-referenced S parameters.
ER -