Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO

Junichiro KADOMOTO; So HASEGAWA; Yusuke KIUCHI; Atsutake KOSUGE; Tadahiro KURODA

doi:10.1587/transele.E99.C.659

Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO

Junichiro KADOMOTO, So HASEGAWA, Yusuke KIUCHI, Atsutake KOSUGE, Tadahiro KURODA

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Summary :

This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.

Publication: IEICE TRANSACTIONS on Electronics Vol.E99-C No.6 pp.659-662

Publication Date: 2016/06/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1587/transele.E99.C.659

Type of Manuscript: BRIEF PAPER

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Authors

Junichiro KADOMOTO
  Keio University
So HASEGAWA
  Keio University
Yusuke KIUCHI
  Keio University
Atsutake KOSUGE
  Keio University
Tadahiro KURODA
  Keio University

Keyword

TCI, 3D integration, LC-VCO, EMI

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Junichiro KADOMOTO, So HASEGAWA, Yusuke KIUCHI, Atsutake KOSUGE, Tadahiro KURODA, "Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO" in IEICE TRANSACTIONS on Electronics, vol. E99-C, no. 6, pp. 659-662, June 2016, doi: 10.1587/transele.E99.C.659.
Abstract: This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E99.C.659/_p

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@ARTICLE{e99-c_6_659,
author={Junichiro KADOMOTO, So HASEGAWA, Yusuke KIUCHI, Atsutake KOSUGE, Tadahiro KURODA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO},
year={2016},
volume={E99-C},
number={6},
pages={659-662},
abstract={This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.},
keywords={},
doi={10.1587/transele.E99.C.659},
ISSN={1745-1353},
month={June},}

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TY - JOUR
TI - Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO
T2 - IEICE TRANSACTIONS on Electronics
SP - 659
EP - 662
AU - Junichiro KADOMOTO
AU - So HASEGAWA
AU - Yusuke KIUCHI
AU - Atsutake KOSUGE
AU - Tadahiro KURODA
PY - 2016
DO - 10.1587/transele.E99.C.659
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E99-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2016
AB - This paper presents analysis and simple design guideline for ThruChip Interface (TCI) as located by LC-VCO which is used in high-speed SoC. The electromagnetic interference (EMI) from TCI channels to LC-VCO is analyzed and evaluated. The accuracy of the analysis and design guidelines is verified through the test-chip verification.
ER -