Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains

Youhua SHI; Nozomu TOGAWA; Shinji KIMURA; Masao YANAGISAWA; Tatsuo OHTSUKI

doi:10.1093/ietfec/e89-a.4.996

Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains

Youhua SHI, Nozomu TOGAWA, Shinji KIMURA, Masao YANAGISAWA, Tatsuo OHTSUKI

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This paper presents a test input data compression technique, Selective Low-Care Coding (SLC), which can be used to significantly reduce input test data volume as well as the external test channel requirement for multiscan-based designs. In the proposed SLC scheme, we explored the linear dependencies of the internal scan chains, and instead of encoding all the specified bits in test cubes, only a smaller amount of specified bits are selected for encoding, thus greater compression can be expected. Experiments on the larger benchmark circuits show drastic reduction in test data volume with corresponding savings on test application time can be indeed achieved even for the well-compacted test set.

Publication: IEICE TRANSACTIONS on Fundamentals Vol.E89-A No.4 pp.996-1004

Publication Date: 2006/04/01

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Online ISSN: 1745-1337

DOI: 10.1093/ietfec/e89-a.4.996

Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)

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Youhua SHI, Nozomu TOGAWA, Shinji KIMURA, Masao YANAGISAWA, Tatsuo OHTSUKI, "Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains" in IEICE TRANSACTIONS on Fundamentals, vol. E89-A, no. 4, pp. 996-1004, April 2006, doi: 10.1093/ietfec/e89-a.4.996.
Abstract: This paper presents a test input data compression technique, Selective Low-Care Coding (SLC), which can be used to significantly reduce input test data volume as well as the external test channel requirement for multiscan-based designs. In the proposed SLC scheme, we explored the linear dependencies of the internal scan chains, and instead of encoding all the specified bits in test cubes, only a smaller amount of specified bits are selected for encoding, thus greater compression can be expected. Experiments on the larger benchmark circuits show drastic reduction in test data volume with corresponding savings on test application time can be indeed achieved even for the well-compacted test set.
URL: https://globals.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e89-a.4.996/_p

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@ARTICLE{e89-a_4_996,
author={Youhua SHI, Nozomu TOGAWA, Shinji KIMURA, Masao YANAGISAWA, Tatsuo OHTSUKI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains},
year={2006},
volume={E89-A},
number={4},
pages={996-1004},
abstract={This paper presents a test input data compression technique, Selective Low-Care Coding (SLC), which can be used to significantly reduce input test data volume as well as the external test channel requirement for multiscan-based designs. In the proposed SLC scheme, we explored the linear dependencies of the internal scan chains, and instead of encoding all the specified bits in test cubes, only a smaller amount of specified bits are selected for encoding, thus greater compression can be expected. Experiments on the larger benchmark circuits show drastic reduction in test data volume with corresponding savings on test application time can be indeed achieved even for the well-compacted test set.},
keywords={},
doi={10.1093/ietfec/e89-a.4.996},
ISSN={1745-1337},
month={April},}

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TY - JOUR
TI - Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 996
EP - 1004
AU - Youhua SHI
AU - Nozomu TOGAWA
AU - Shinji KIMURA
AU - Masao YANAGISAWA
AU - Tatsuo OHTSUKI
PY - 2006
DO - 10.1093/ietfec/e89-a.4.996
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E89-A
IS - 4
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - April 2006
AB - This paper presents a test input data compression technique, Selective Low-Care Coding (SLC), which can be used to significantly reduce input test data volume as well as the external test channel requirement for multiscan-based designs. In the proposed SLC scheme, we explored the linear dependencies of the internal scan chains, and instead of encoding all the specified bits in test cubes, only a smaller amount of specified bits are selected for encoding, thus greater compression can be expected. Experiments on the larger benchmark circuits show drastic reduction in test data volume with corresponding savings on test application time can be indeed achieved even for the well-compacted test set.
ER -