A Precise Event-Driven MOS Circhit Simulator

Tetsuro KAGE; Hisanori FUJISAWA; Fumiyo KAWAFUJI; Tomoyasu KITAURA

A Precise Event-Driven MOS Circhit Simulator

Tetsuro KAGE, Hisanori FUJISAWA, Fumiyo KAWAFUJI, Tomoyasu KITAURA

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Circuit simulators are used to verify circuit functionality and to obtain detailed timing information before the expensive fabrication process takes place. They have become an essential CAD tool in an era of sub-micron technology. We have developed a new event-driven MOS circuit simulator to replace a direct method circuit simulator. In our simulator, partitioned subcircuits are analyzed by a direct method matrix solver, and these are controlled by an event-driven scheme to maintain accuracy. The key of this approach is how to manage events for circuit simulation. We introduced two types of events: self-control events for a subcircuit and prediction correcting events between subcircuits. They control simulation accuracy, and bring simulation efficiency through multi-rate behavior of a large scale circuit. The event-driven scheme also brings some useful functions which are not available from a direct method circuit simulator, such as a selected block simulation function and a batch simulation function for load variation. We simulated logic modules (buffer, adder, and counter) with about 1000 MOSFETs with our event-driven MOS circuit simulator. Our simulator was 5-7 times faster than a SPICE-like circuit simulator, while maintaining the less than 1% error accuracy. The selected block simulation function enables to shorten simulation time without losing any accuracy by selecting valid blocks in a circuit to simulate specified node waveforms. Using this function, the logic modules were simulated 13-28 times faster than the SPICE-like circuit simulator while maintaining the same accuracy.

Publication: IEICE TRANSACTIONS on Fundamentals Vol.E79-A No.3 pp.339-346

Publication Date: 1996/03/25

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Type of Manuscript: Special Section PAPER (Special Section of Selected Papers from the 8th Karuizawa Workshop on Circuits and Systems)

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Tetsuro KAGE, Hisanori FUJISAWA, Fumiyo KAWAFUJI, Tomoyasu KITAURA, "A Precise Event-Driven MOS Circhit Simulator" in IEICE TRANSACTIONS on Fundamentals, vol. E79-A, no. 3, pp. 339-346, March 1996, doi: .
Abstract: Circuit simulators are used to verify circuit functionality and to obtain detailed timing information before the expensive fabrication process takes place. They have become an essential CAD tool in an era of sub-micron technology. We have developed a new event-driven MOS circuit simulator to replace a direct method circuit simulator. In our simulator, partitioned subcircuits are analyzed by a direct method matrix solver, and these are controlled by an event-driven scheme to maintain accuracy. The key of this approach is how to manage events for circuit simulation. We introduced two types of events: self-control events for a subcircuit and prediction correcting events between subcircuits. They control simulation accuracy, and bring simulation efficiency through multi-rate behavior of a large scale circuit. The event-driven scheme also brings some useful functions which are not available from a direct method circuit simulator, such as a selected block simulation function and a batch simulation function for load variation. We simulated logic modules (buffer, adder, and counter) with about 1000 MOSFETs with our event-driven MOS circuit simulator. Our simulator was 5-7 times faster than a SPICE-like circuit simulator, while maintaining the less than 1% error accuracy. The selected block simulation function enables to shorten simulation time without losing any accuracy by selecting valid blocks in a circuit to simulate specified node waveforms. Using this function, the logic modules were simulated 13-28 times faster than the SPICE-like circuit simulator while maintaining the same accuracy.
URL: https://globals.ieice.org/en_transactions/fundamentals/10.1587/e79-a_3_339/_p

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@ARTICLE{e79-a_3_339,
author={Tetsuro KAGE, Hisanori FUJISAWA, Fumiyo KAWAFUJI, Tomoyasu KITAURA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Precise Event-Driven MOS Circhit Simulator},
year={1996},
volume={E79-A},
number={3},
pages={339-346},
abstract={Circuit simulators are used to verify circuit functionality and to obtain detailed timing information before the expensive fabrication process takes place. They have become an essential CAD tool in an era of sub-micron technology. We have developed a new event-driven MOS circuit simulator to replace a direct method circuit simulator. In our simulator, partitioned subcircuits are analyzed by a direct method matrix solver, and these are controlled by an event-driven scheme to maintain accuracy. The key of this approach is how to manage events for circuit simulation. We introduced two types of events: self-control events for a subcircuit and prediction correcting events between subcircuits. They control simulation accuracy, and bring simulation efficiency through multi-rate behavior of a large scale circuit. The event-driven scheme also brings some useful functions which are not available from a direct method circuit simulator, such as a selected block simulation function and a batch simulation function for load variation. We simulated logic modules (buffer, adder, and counter) with about 1000 MOSFETs with our event-driven MOS circuit simulator. Our simulator was 5-7 times faster than a SPICE-like circuit simulator, while maintaining the less than 1% error accuracy. The selected block simulation function enables to shorten simulation time without losing any accuracy by selecting valid blocks in a circuit to simulate specified node waveforms. Using this function, the logic modules were simulated 13-28 times faster than the SPICE-like circuit simulator while maintaining the same accuracy.},
keywords={},
doi={},
ISSN={},
month={March},}

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TY - JOUR
TI - A Precise Event-Driven MOS Circhit Simulator
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 339
EP - 346
AU - Tetsuro KAGE
AU - Hisanori FUJISAWA
AU - Fumiyo KAWAFUJI
AU - Tomoyasu KITAURA
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E79-A
IS - 3
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - March 1996
AB - Circuit simulators are used to verify circuit functionality and to obtain detailed timing information before the expensive fabrication process takes place. They have become an essential CAD tool in an era of sub-micron technology. We have developed a new event-driven MOS circuit simulator to replace a direct method circuit simulator. In our simulator, partitioned subcircuits are analyzed by a direct method matrix solver, and these are controlled by an event-driven scheme to maintain accuracy. The key of this approach is how to manage events for circuit simulation. We introduced two types of events: self-control events for a subcircuit and prediction correcting events between subcircuits. They control simulation accuracy, and bring simulation efficiency through multi-rate behavior of a large scale circuit. The event-driven scheme also brings some useful functions which are not available from a direct method circuit simulator, such as a selected block simulation function and a batch simulation function for load variation. We simulated logic modules (buffer, adder, and counter) with about 1000 MOSFETs with our event-driven MOS circuit simulator. Our simulator was 5-7 times faster than a SPICE-like circuit simulator, while maintaining the less than 1% error accuracy. The selected block simulation function enables to shorten simulation time without losing any accuracy by selecting valid blocks in a circuit to simulate specified node waveforms. Using this function, the logic modules were simulated 13-28 times faster than the SPICE-like circuit simulator while maintaining the same accuracy.
ER -