A Necessary and Sufficient Condition of Supply and Threshold Voltages in CMOS Circuits for Minimum Energy Point Operation

Jun SHIOMI; Tohru ISHIHARA; Hidetoshi ONODERA

doi:10.1587/transfun.E100.A.2764

A Necessary and Sufficient Condition of Supply and Threshold Voltages in CMOS Circuits for Minimum Energy Point Operation

Jun SHIOMI, Tohru ISHIHARA, Hidetoshi ONODERA

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Scaling supply voltage (V_DD) and threshold voltage (V_th) dynamically has a strong impact on energy efficiency of CMOS LSI circuits. Techniques for optimizing V_DD and V_th simultaneously under dynamic workloads are thus widely investigated over the past 15 years. In this paper, we refer to the optimum pair of V_DD and V_th, which minimizes the energy consumption of a circuit under a specific performance constraint, as a minimum energy point (MEP). Based on the simple transregional models of a CMOS circuit, this paper derives a simple necessary and sufficient condition for the MEP operation. The simple condition helps find the MEP of CMOS circuits. Measurement results using standard-cell based memories (SCMs) fabricated in a 65-nm process technology also validate the condition derived in this paper.

Publication: IEICE TRANSACTIONS on Fundamentals Vol.E100-A No.12 pp.2764-2775

Publication Date: 2017/12/01

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Online ISSN: 1745-1337

DOI: 10.1587/transfun.E100.A.2764

Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)

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Authors

Jun SHIOMI
  Kyoto University
Tohru ISHIHARA
  Kyoto University
Hidetoshi ONODERA
  Kyoto University

Keyword

minimum energy point tracking (MEPT), dynamic voltage and frequency scaling (DVFS), adaptive body biasing (ABB), standard-cell based memory (SCM)

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Jun SHIOMI, Tohru ISHIHARA, Hidetoshi ONODERA, "A Necessary and Sufficient Condition of Supply and Threshold Voltages in CMOS Circuits for Minimum Energy Point Operation" in IEICE TRANSACTIONS on Fundamentals, vol. E100-A, no. 12, pp. 2764-2775, December 2017, doi: 10.1587/transfun.E100.A.2764.
Abstract: Scaling supply voltage (V_DD) and threshold voltage (V_th) dynamically has a strong impact on energy efficiency of CMOS LSI circuits. Techniques for optimizing V_DD and V_th simultaneously under dynamic workloads are thus widely investigated over the past 15 years. In this paper, we refer to the optimum pair of V_DD and V_th, which minimizes the energy consumption of a circuit under a specific performance constraint, as a minimum energy point (MEP). Based on the simple transregional models of a CMOS circuit, this paper derives a simple necessary and sufficient condition for the MEP operation. The simple condition helps find the MEP of CMOS circuits. Measurement results using standard-cell based memories (SCMs) fabricated in a 65-nm process technology also validate the condition derived in this paper.
URL: https://globals.ieice.org/en_transactions/fundamentals/10.1587/transfun.E100.A.2764/_p

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@ARTICLE{e100-a_12_2764,
author={Jun SHIOMI, Tohru ISHIHARA, Hidetoshi ONODERA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Necessary and Sufficient Condition of Supply and Threshold Voltages in CMOS Circuits for Minimum Energy Point Operation},
year={2017},
volume={E100-A},
number={12},
pages={2764-2775},
abstract={Scaling supply voltage (V_DD) and threshold voltage (V_th) dynamically has a strong impact on energy efficiency of CMOS LSI circuits. Techniques for optimizing V_DD and V_th simultaneously under dynamic workloads are thus widely investigated over the past 15 years. In this paper, we refer to the optimum pair of V_DD and V_th, which minimizes the energy consumption of a circuit under a specific performance constraint, as a minimum energy point (MEP). Based on the simple transregional models of a CMOS circuit, this paper derives a simple necessary and sufficient condition for the MEP operation. The simple condition helps find the MEP of CMOS circuits. Measurement results using standard-cell based memories (SCMs) fabricated in a 65-nm process technology also validate the condition derived in this paper.},
keywords={},
doi={10.1587/transfun.E100.A.2764},
ISSN={1745-1337},
month={December},}

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TY - JOUR
TI - A Necessary and Sufficient Condition of Supply and Threshold Voltages in CMOS Circuits for Minimum Energy Point Operation
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2764
EP - 2775
AU - Jun SHIOMI
AU - Tohru ISHIHARA
AU - Hidetoshi ONODERA
PY - 2017
DO - 10.1587/transfun.E100.A.2764
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E100-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2017
AB - Scaling supply voltage (V_DD) and threshold voltage (V_th) dynamically has a strong impact on energy efficiency of CMOS LSI circuits. Techniques for optimizing V_DD and V_th simultaneously under dynamic workloads are thus widely investigated over the past 15 years. In this paper, we refer to the optimum pair of V_DD and V_th, which minimizes the energy consumption of a circuit under a specific performance constraint, as a minimum energy point (MEP). Based on the simple transregional models of a CMOS circuit, this paper derives a simple necessary and sufficient condition for the MEP operation. The simple condition helps find the MEP of CMOS circuits. Measurement results using standard-cell based memories (SCMs) fabricated in a 65-nm process technology also validate the condition derived in this paper.
ER -