Test Set for a Multibit Shifter Constructed with Multiplexers

Tokumi YOKOHIRA; Hiroyuki MICHINISHI; Takuji OKAMOTO; Yuji SUGIYAMA

Test Set for a Multibit Shifter Constructed with Multiplexers

Tokumi YOKOHIRA, Hiroyuki MICHINISHI, Takuji OKAMOTO, Yuji SUGIYAMA

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This paper considers a test set for a multibit shifter which can execute arbitrary bit length shifting/rotating operations. The multibit shifter consists of several stages of sub-shifters, each of which can shift/rotate its inputs by an arbitrary number of bits less than or equal to a predetermined constant. Outputs of one sub-shifter are shifted/rotated in the next sub-shifted. All of the sub-shifters have the same structure, and are constructed with multiplexers. Every sub-shirter is separately tested. All of the multiplexers in each sub-shifter are tested in parallel and exhaustively. A minimum test set for every sub-shifter can be obtained by the use of an algorithm which generates a Boolean 2^pq matrix M such that any 2^pp submatrix of M includes all bit patterns of length p, where p and q (pq) are the numbers of input lines in a multiplexer and those in a sub-shifter, respectively. A complete test set for the multibit shifter can be easily obtained as the union of minimum test sets for all sub-shifters.

Publication: IEICE TRANSACTIONS on transactions Vol.E73-E No.8 pp.1301-1309

Publication Date: 1990/08/25

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Type of Manuscript: Special Section PAPER (Special Issue on Fault-Tolerant Systems)

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Tokumi YOKOHIRA
Hiroyuki MICHINISHI
Takuji OKAMOTO
Yuji SUGIYAMA

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Tokumi YOKOHIRA, Hiroyuki MICHINISHI, Takuji OKAMOTO, Yuji SUGIYAMA, "Test Set for a Multibit Shifter Constructed with Multiplexers" in IEICE TRANSACTIONS on transactions, vol. E73-E, no. 8, pp. 1301-1309, August 1990, doi: .
Abstract: This paper considers a test set for a multibit shifter which can execute arbitrary bit length shifting/rotating operations. The multibit shifter consists of several stages of sub-shifters, each of which can shift/rotate its inputs by an arbitrary number of bits less than or equal to a predetermined constant. Outputs of one sub-shifter are shifted/rotated in the next sub-shifted. All of the sub-shifters have the same structure, and are constructed with multiplexers. Every sub-shirter is separately tested. All of the multiplexers in each sub-shifter are tested in parallel and exhaustively. A minimum test set for every sub-shifter can be obtained by the use of an algorithm which generates a Boolean 2^pq matrix M such that any 2^pp submatrix of M includes all bit patterns of length p, where p and q (pq) are the numbers of input lines in a multiplexer and those in a sub-shifter, respectively. A complete test set for the multibit shifter can be easily obtained as the union of minimum test sets for all sub-shifters.
URL: https://globals.ieice.org/en_transactions/transactions/10.1587/e73-e_8_1301/_p

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@ARTICLE{e73-e_8_1301,
author={Tokumi YOKOHIRA, Hiroyuki MICHINISHI, Takuji OKAMOTO, Yuji SUGIYAMA, },
journal={IEICE TRANSACTIONS on transactions},
title={Test Set for a Multibit Shifter Constructed with Multiplexers},
year={1990},
volume={E73-E},
number={8},
pages={1301-1309},
abstract={This paper considers a test set for a multibit shifter which can execute arbitrary bit length shifting/rotating operations. The multibit shifter consists of several stages of sub-shifters, each of which can shift/rotate its inputs by an arbitrary number of bits less than or equal to a predetermined constant. Outputs of one sub-shifter are shifted/rotated in the next sub-shifted. All of the sub-shifters have the same structure, and are constructed with multiplexers. Every sub-shirter is separately tested. All of the multiplexers in each sub-shifter are tested in parallel and exhaustively. A minimum test set for every sub-shifter can be obtained by the use of an algorithm which generates a Boolean 2^pq matrix M such that any 2^pp submatrix of M includes all bit patterns of length p, where p and q (pq) are the numbers of input lines in a multiplexer and those in a sub-shifter, respectively. A complete test set for the multibit shifter can be easily obtained as the union of minimum test sets for all sub-shifters.},
keywords={},
doi={},
ISSN={},
month={August},}

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TY - JOUR
TI - Test Set for a Multibit Shifter Constructed with Multiplexers
T2 - IEICE TRANSACTIONS on transactions
SP - 1301
EP - 1309
AU - Tokumi YOKOHIRA
AU - Hiroyuki MICHINISHI
AU - Takuji OKAMOTO
AU - Yuji SUGIYAMA
PY - 1990
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E73-E
IS - 8
JA - IEICE TRANSACTIONS on transactions
Y1 - August 1990
AB - This paper considers a test set for a multibit shifter which can execute arbitrary bit length shifting/rotating operations. The multibit shifter consists of several stages of sub-shifters, each of which can shift/rotate its inputs by an arbitrary number of bits less than or equal to a predetermined constant. Outputs of one sub-shifter are shifted/rotated in the next sub-shifted. All of the sub-shifters have the same structure, and are constructed with multiplexers. Every sub-shirter is separately tested. All of the multiplexers in each sub-shifter are tested in parallel and exhaustively. A minimum test set for every sub-shifter can be obtained by the use of an algorithm which generates a Boolean 2^pq matrix M such that any 2^pp submatrix of M includes all bit patterns of length p, where p and q (pq) are the numbers of input lines in a multiplexer and those in a sub-shifter, respectively. A complete test set for the multibit shifter can be easily obtained as the union of minimum test sets for all sub-shifters.
ER -