This paper describes a flash ADC using interpolation (IP) and cyclic background self-calibrating techniques. The proposed IP technique that is cascade of capacitor IP and gate IP with dynamic double-tail latched comparator reduces non-linearity, power consumption, and occupied area. The cyclic background self-calibrating technique periodically suppresses offset mismatch voltages caused by static fluctuation and dynamic fluctuation due to temperature and supply voltage changes. The ADC has been fabricated in 90-nm 1P10M CMOS technology. Experimental results show that the ADC achieves SNDR of 6.07 bits without calibration and 6.74 bits with calibration up to 500 MHz input signal at sampling rate of 600 MSps. It dissipates 98.5 mW on 1.2-V supply. FoM is 1.54 pJ/conv.

A 6-bit, 7 mW, 700 MS/s subranging ADC using Capacitive DAC (CDAC) and gate-weighted interpolation fabricated in 90 nm CMOS technology is demonstrated. CDACs are used as a reference selection circuit instead of resistive DACs (RDAC) for reducing settling time and power dissipation. A gate-weighted interpolation scheme is also incorporated to the comparators, to reduce the circuit components, power dissipation and mismatch of conversion stages. By virtue of recent technology scaling, an interpolation can be realized in the saturation region with small error. A digital offset calibration technique using capacitor reduces comparator's offset voltage from 10 mV to 1.5 mV per sigma. Experimental results show that the proposed ADC achieves a SNDR of 34 dB with calibration and FoM is 250 fJ/conv., which is very attractive as an embedded IP for low power SoCs.