This paper presents a high resolution mixed-domain Delta-Sigma (ΔΣ) time-to-digital converter (TDC) which utilizes a charge pump as time-to-voltage converter, a low resolution SAR ADC as quantizer, and a pair of delay-line digital-to-time converters to form a negative feedback. By never resetting the sampling capacitor of the charge-pump, an integrator is realized and first order noise shaping can be achieved. However, since the integrating capacitor is never cleared, this circuit is prone to charge-sharing issue during input sampling which can degrade TDC's performance. To deal with this issue, a compensation circuit consists of another pair of sampling capacitors and charge-pumps with doubled current is proposed. This TDC is designed and simulated in 65 nm CMOS technology and can operate at 200 MHz sampling frequency. For 2.5 MHz bandwidth, simulation shows that this TDC achieves 66.4 dB SNDR and 295 fsrms integrated noise for ±1 ns input range. The proposed TDC consumes 1.78 mW power that translates to FoM of 208 fJ/conv.
Anugerah FIRDAUZI
Tokyo Institute of Technology
Zule XU
Tokyo University of Science
Masaya MIYAHARA
Tokyo Institute of Technology
Akira MATSUZAWA
Tokyo Institute of Technology
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Copy
Anugerah FIRDAUZI, Zule XU, Masaya MIYAHARA, Akira MATSUZAWA, "High Resolution Mixed-Domain Delta-Sigma Time-to-Digital Converter Using Compensated Charge-Pump Integrator" in IEICE TRANSACTIONS on Electronics,
vol. E100-C, no. 6, pp. 548-559, June 2017, doi: 10.1587/transele.E100.C.548.
Abstract: This paper presents a high resolution mixed-domain Delta-Sigma (ΔΣ) time-to-digital converter (TDC) which utilizes a charge pump as time-to-voltage converter, a low resolution SAR ADC as quantizer, and a pair of delay-line digital-to-time converters to form a negative feedback. By never resetting the sampling capacitor of the charge-pump, an integrator is realized and first order noise shaping can be achieved. However, since the integrating capacitor is never cleared, this circuit is prone to charge-sharing issue during input sampling which can degrade TDC's performance. To deal with this issue, a compensation circuit consists of another pair of sampling capacitors and charge-pumps with doubled current is proposed. This TDC is designed and simulated in 65 nm CMOS technology and can operate at 200 MHz sampling frequency. For 2.5 MHz bandwidth, simulation shows that this TDC achieves 66.4 dB SNDR and 295 fsrms integrated noise for ±1 ns input range. The proposed TDC consumes 1.78 mW power that translates to FoM of 208 fJ/conv.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E100.C.548/_p
Copy
@ARTICLE{e100-c_6_548,
author={Anugerah FIRDAUZI, Zule XU, Masaya MIYAHARA, Akira MATSUZAWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={High Resolution Mixed-Domain Delta-Sigma Time-to-Digital Converter Using Compensated Charge-Pump Integrator},
year={2017},
volume={E100-C},
number={6},
pages={548-559},
abstract={This paper presents a high resolution mixed-domain Delta-Sigma (ΔΣ) time-to-digital converter (TDC) which utilizes a charge pump as time-to-voltage converter, a low resolution SAR ADC as quantizer, and a pair of delay-line digital-to-time converters to form a negative feedback. By never resetting the sampling capacitor of the charge-pump, an integrator is realized and first order noise shaping can be achieved. However, since the integrating capacitor is never cleared, this circuit is prone to charge-sharing issue during input sampling which can degrade TDC's performance. To deal with this issue, a compensation circuit consists of another pair of sampling capacitors and charge-pumps with doubled current is proposed. This TDC is designed and simulated in 65 nm CMOS technology and can operate at 200 MHz sampling frequency. For 2.5 MHz bandwidth, simulation shows that this TDC achieves 66.4 dB SNDR and 295 fsrms integrated noise for ±1 ns input range. The proposed TDC consumes 1.78 mW power that translates to FoM of 208 fJ/conv.},
keywords={},
doi={10.1587/transele.E100.C.548},
ISSN={1745-1353},
month={June},}
Copy
TY - JOUR
TI - High Resolution Mixed-Domain Delta-Sigma Time-to-Digital Converter Using Compensated Charge-Pump Integrator
T2 - IEICE TRANSACTIONS on Electronics
SP - 548
EP - 559
AU - Anugerah FIRDAUZI
AU - Zule XU
AU - Masaya MIYAHARA
AU - Akira MATSUZAWA
PY - 2017
DO - 10.1587/transele.E100.C.548
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E100-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2017
AB - This paper presents a high resolution mixed-domain Delta-Sigma (ΔΣ) time-to-digital converter (TDC) which utilizes a charge pump as time-to-voltage converter, a low resolution SAR ADC as quantizer, and a pair of delay-line digital-to-time converters to form a negative feedback. By never resetting the sampling capacitor of the charge-pump, an integrator is realized and first order noise shaping can be achieved. However, since the integrating capacitor is never cleared, this circuit is prone to charge-sharing issue during input sampling which can degrade TDC's performance. To deal with this issue, a compensation circuit consists of another pair of sampling capacitors and charge-pumps with doubled current is proposed. This TDC is designed and simulated in 65 nm CMOS technology and can operate at 200 MHz sampling frequency. For 2.5 MHz bandwidth, simulation shows that this TDC achieves 66.4 dB SNDR and 295 fsrms integrated noise for ±1 ns input range. The proposed TDC consumes 1.78 mW power that translates to FoM of 208 fJ/conv.
ER -